2016 IEEE Symposium on VLSI Technology 2016
DOI: 10.1109/vlsit.2016.7573366
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Random soft error suppression by stoichiometric engineering: CMOS compatible and reliable 1Mb HfO<inf>2</inf>-ReRAM with 2 extra masks for embedded IoT systems

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Cited by 5 publications
(3 citation statements)
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“…We show the published cell size for all technologies discussed above in figure 1(c), i.e. SRAM [46][47][48][49][50][51][52][53], eDRAM [54][55][56][57][58][59], eFlash [60][61][62][63][64][65][66][67], DRAM [41,68], eReRAM [69][70][71][72][73], STT-MRAM [42,[74][75][76][77][78][79][80][81][82][83][84][85][86][87]. Note that the SRAM cell sizes down to 7 nm are from literature while the cell sizes (F 2 ) for 3 and 5 nm are linear extrapolation based on the cell sizes from 22 nm to 7 nm.…”
Section: Scaling Analysismentioning
confidence: 99%
“…We show the published cell size for all technologies discussed above in figure 1(c), i.e. SRAM [46][47][48][49][50][51][52][53], eDRAM [54][55][56][57][58][59], eFlash [60][61][62][63][64][65][66][67], DRAM [41,68], eReRAM [69][70][71][72][73], STT-MRAM [42,[74][75][76][77][78][79][80][81][82][83][84][85][86][87]. Note that the SRAM cell sizes down to 7 nm are from literature while the cell sizes (F 2 ) for 3 and 5 nm are linear extrapolation based on the cell sizes from 22 nm to 7 nm.…”
Section: Scaling Analysismentioning
confidence: 99%
“…Among different types of NVMs, RRAM has shown great potential in the in-memory applications due to its merits such as nanometers cell dimension [18,28,29], nanoseconds switching speed [19,30,31], and microampere of read-write current with a low operation voltage [20,32,33]. Furthermore, it has a high OFF/ON resistance ratio [17,34,35] and good reliability, including data retention and cycle endurance [21,36,37]. Therefore, RRAM is chosen for this design to implement an 8-bit radix-4 non-volatile logic.…”
Section: Resistive Non-volatile Memorymentioning
confidence: 99%
“…We chose the RRAM in our multiplier design due to its potential in computation application utilizing smaller cell dimension, faster-switching speed, low I/V demands for read-write operation, and high OFF/ON resistance ratio [17]. In addition, it has higher reliability, data retention, and cycle endurance [18][19][20][21]. These characteristics make it a superior option for in-memory computing.…”
Section: Introductionmentioning
confidence: 99%