Raman spectroscopy of Bi2Se3-xTex (x = 0–3) topological insulator crystals

High field magneto-transport of mixed topological insulators Bi2Se3-xTex (x = 0, 1, 2 & 3)

“…This shifting to lower angle side in XRD pattern is due to doping of Se atom as the Se has a small atomic radius as compared to Te atom. Due to the same reason, there is a huge Raman shift in MTI as compared to TI which is described in our prevoious report [27]. Figure 3 shows SEM images of grown TI and MTI crystals which show that crystals have layered structure which are in direct accordance with the unidirectional growth of crystals.…”

“…The Raman spectra have been in direct accordance with the PXRD analysis as there is a shift in Raman mode as we go from Bi2Te3 to Bi2Se3, where MTI lies in between. The reason behind these characteristics Raman shift has been explained in our previous report [27]. Fig.…”

“…The obtained lattice parameters from Rietveld refinement are shown in table 1. It is observed that the lattice parameters increases with increasing tellurium (Te) concentration in Bi2Se3, which is described in details in our previous report [27]. Using VESTA software, the crystal structures of Bi2Te3, Bi2Se1Te2, Bi2Se2Te1, and Bi2Se3 single crystals (as shown in fig.…”

“…The TI and MTI synthesized through a well-optimized solid-state reaction route as described in our previous report [27]. These crystals have been characterized through PXRD (powdered X-ray Diffractometry) and thereby their Rietveld refinement confirms the particular phase of the crystal.…”

“…Bismuth (Bi) based TI and MTI single crystals have synthesized by using the self-flux method via solid-state reaction route [7,8]. The optimal heat treatment for the MTI have been discussed in our previous reports [27]. The XRD measurements have been performed on mechanically cleaved single-crystal flakes using the Rigaku X-ray diffractometer with the CuKα radiation ( = 1.5418 Å).…”