“…Raman microscopy is a nondestructive, non-contact, and local (≈1m 2 lateral resolution [23]) technique that has been proved to be sensitive to Be stretching modes [24], beryllium oxide modes [25], bending and stretching tungsten oxide modes [26], Be x W y mixed samples density of states [27], Be-C-W irradiated samples [28], and give information when a pristine material is implanted by hydrogen ions [27,29,30]. First Raman analyses in ILW-tokamaks were performed on several molybdenum JET mirrors [27], showing that the technique is sensitive to thin (≈10 nm) deposited layer composed of ≈33% Be, ≈33% C and ≈33% O and to the underlying molybdenum oxidized mirror, the atomic percent being obtained by X-ray Photon spectroscopy (XPS). C-O and C=O modes have been detected in that layer, and defective or beryllium mixed with O and/or C have been found without possibility to identify the phases rigorously up to now, because of a poor benchmarking of the technique for these materials.…”