2015
DOI: 10.3390/ma8052782
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Raman Microscopic Analysis of Internal Stress in Boron-Doped Diamond

Abstract: Analysis of the induced stress on undoped and boron-doped diamond (BDD) thin films by confocal Raman microscopy is performed in this study to investigate its correlation with sample chemical composition and the substrate used during fabrication. Knowledge of this nature is very important to the issue of long-term stability of BDD coated neurosurgical electrodes that will be used in fast-scan cyclic voltammetry, as potential occurrence of film delaminations and dislocations during their surgical implantation ca… Show more

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Cited by 6 publications
(3 citation statements)
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References 29 publications
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“…Complementary analysis of CFs by confocal Raman microscopy is also presented in Figure 4a–e. A well-established characterization method in studying carbon-based materials, Raman technique has traditionally played an important role in providing information on sp 2 or sp 3 hybridization in materials, existence of chemical impurities, defects, and other crystal disorders, such as induced strain [4,6,7,8,9,15,19,32,33,34,35,41,42,43]. As compared with the previous images of conventional SEM, the surface and cross-sectional confocal Raman mapping images presented in Figure 4a–d show regions that do not lie within the focal plane of the optics and that are therefore not well defined.…”
Section: Resultsmentioning
confidence: 99%
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“…Complementary analysis of CFs by confocal Raman microscopy is also presented in Figure 4a–e. A well-established characterization method in studying carbon-based materials, Raman technique has traditionally played an important role in providing information on sp 2 or sp 3 hybridization in materials, existence of chemical impurities, defects, and other crystal disorders, such as induced strain [4,6,7,8,9,15,19,32,33,34,35,41,42,43]. As compared with the previous images of conventional SEM, the surface and cross-sectional confocal Raman mapping images presented in Figure 4a–d show regions that do not lie within the focal plane of the optics and that are therefore not well defined.…”
Section: Resultsmentioning
confidence: 99%
“…However, boron-doped diamond (BDD) thin film coatings on metallic rods or on silicon substrates have been used as alternatives for improving stability, limiting background noise, and reducing microelectrode fouling [9,15,32,33]. While improved physico-chemical stability has been reported for these BDD-based microelectrodes, a lower sensitivity to neurotransmitter detection was also found, through FSCV analysis, in comparison to CFMs.…”
Section: Introductionmentioning
confidence: 99%
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