“…Complementary analysis of CFs by confocal Raman microscopy is also presented in Figure 4a–e. A well-established characterization method in studying carbon-based materials, Raman technique has traditionally played an important role in providing information on sp 2 or sp 3 hybridization in materials, existence of chemical impurities, defects, and other crystal disorders, such as induced strain [4,6,7,8,9,15,19,32,33,34,35,41,42,43]. As compared with the previous images of conventional SEM, the surface and cross-sectional confocal Raman mapping images presented in Figure 4a–d show regions that do not lie within the focal plane of the optics and that are therefore not well defined.…”