Raman investigation on sol-gel grown PbTiO3 thin films

Abstract

Sol-gel prepared lead titanate thin films on platinumcoated silicon and on sapphire were studied. The frequency shift of the modes and the shift of the c-parameter with respect to the bulk material were associated with compressive stress in the films, which is not homogeneous. The PT films on silicon (6 h and 12 h) show an incomplete solid reaction, where an amorphous phase and the formation of T i 9 were found. However, near the edge of the F T films, perovskite phase was observed. On the other hand, the PT film on A1,Q presents a polycrystalline perovskite structure. where a pyrochlore second phase was identified.