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1985
DOI: 10.1016/0038-1098(85)90213-3
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Raman and infrared reflection spectroscopy in black phosphorus

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Cited by 221 publications
(213 citation statements)
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“…As carbon atoms in graphene, each phosphorus atom is connected to three adjacent phosphorus atoms in BP to form a stable, linked ring structure, with each ring consisting of six phosphorus atoms. However, the puckered BP structure has reduced symmetry compared with graphite, resulting in its unique angle-dependent in-plane conductivities [33][34][35][36] . The adjacent layer spacing is around 0.53 nm and the lattice constant in this orthorhombic system along the z direction is 1.05 nm.…”
Section: Resultsmentioning
confidence: 99%
“…As carbon atoms in graphene, each phosphorus atom is connected to three adjacent phosphorus atoms in BP to form a stable, linked ring structure, with each ring consisting of six phosphorus atoms. However, the puckered BP structure has reduced symmetry compared with graphite, resulting in its unique angle-dependent in-plane conductivities [33][34][35][36] . The adjacent layer spacing is around 0.53 nm and the lattice constant in this orthorhombic system along the z direction is 1.05 nm.…”
Section: Resultsmentioning
confidence: 99%
“…Moreover, it is found that their excitation laser polarization dependence can be used to determine the crystal orientation of BP 45,47 . However, the frequencies of HF intralayer modes are found to exhibit almost no dependence on film thickness [44][45][46][47] . Clearly, the 4 study of the LF interlayer phonon modes in few-layer BP (Fig.…”
mentioning
confidence: 95%
“…[18,19] For incident and scattered light propagating normal to the planes of the flakes, the selection rules 4 permit observation of three modes [19] To orient our encapsulated BP samples prior to thermal measurement, we take angleresolved, parallel polarized Raman spectra, as shown in Figure 2 and Figure S2. We subtract polynomial baselines from the spectra, Lorentzian fit them, and then normalize their peak intensity values.…”
mentioning
confidence: 99%
“…[18,19] For incident and scattered light propagating normal to the planes of the flakes, the selection rules 4 permit observation of three modes [19] A intensities depend on the polarization direction in the a-c plane and can be used to determine the crystal orientation. [19] Further, we note that the Raman intensity of the Si TO phonon (~521 cm −1 ) varies with sample orientation, as both the intrinsic Si Raman tensor and BP's optical constants are angle-dependent.…”
mentioning
confidence: 99%