2006
DOI: 10.1016/j.molstruc.2006.01.068
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Raman and FIR reflection spectroscopy of ZnP2 and CdP2 single crystals

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Cited by 16 publications
(8 citation statements)
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“…[2,3] coincide, the absolute value of the reflectance is different and hence does not enable the precise determination of the high-frequency dielectric permittivity. In our previous papers we have presented the dielectric permittivity dispersion in the MIR for Ejjc and E?c [4] in the MIR and the FIR (but only down to 80 cm À1 [5]). Data for the dielectric permittivity dispersion of ZnP 2 for Ejjc in the FIR have not yet been presented.…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…[2,3] coincide, the absolute value of the reflectance is different and hence does not enable the precise determination of the high-frequency dielectric permittivity. In our previous papers we have presented the dielectric permittivity dispersion in the MIR for Ejjc and E?c [4] in the MIR and the FIR (but only down to 80 cm À1 [5]). Data for the dielectric permittivity dispersion of ZnP 2 for Ejjc in the FIR have not yet been presented.…”
Section: Introductionmentioning
confidence: 99%
“…Therefore, spectra of diphosphides measured at low temperatures can provide valuable additional information about the phonon contribution to the permittivity [6,7]. Previous studies [2][3][4][5] have presented IR reflectance and Raman spectra of ZnP 2 taken at 300 K, but no information has been available regarding IR reflectance and Raman spectra of ZnP 2 at low temperatures.…”
Section: Introductionmentioning
confidence: 99%
“…The intermediate weak bands are assigned to Γ 5 T and Γ 4 L modes. No peaks corresponding to possible by‐products (ZnP 2 /Zn 3 P 2 ) are present [29–31] . XPS technique is used to investigate the composition where the survey spectrum (Figure S3) shows the presence of Zn, Sn and P. Zinc is present in +2 state and the high‐resolution 2p core level region (Figure 2b) exhibits spin orbit doublet peaks at 1021.8 and 1044.9 eV corresponding to Zn 2p 3/2 and Zn 2p 1/2 levels, respectively.…”
Section: Resultsmentioning
confidence: 99%
“…Such crystallization processes can be adequately studied at the level of atomistic structural arrangement using numerous experimental measuring techniques, such as IR vibrational and Raman scattering spectroscopy, X-ray diffraction (XRD), X-ray photoelectron spectroscopy, atomic force microscopy (AFM) and scanning electron microscopy (SEM), nuclear magnetic resonance, etc. [7][8][9][10][11][12]. However, the row of experimental probes available to study atomic-deficient void structure of such materials is rather limited, especially at nanometer and sub-nanometer scale.…”
Section: Introductionmentioning
confidence: 99%