Radiotracer measurements as a sensitive tool for the detection of metal penetration in molecular-based organic electronics

Scharnberg, M.; Hu, Jing; Kanzow, J.; Rätzke, Klaus; Adelung, Rainer; Faupel, Franz; Pannemann, C.; Hilleringmann, Ulrich; Meyer, Stephan; Pflaum, Jens

doi:10.1063/1.1849845

Cited by 33 publications

(19 citation statements)

References 18 publications

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“…The FWHM of 0.014°indicates extremely high degree of out-of-plane order and is one of the best values obtained so far for organic thin films. [8] This rocking width is almost two orders-of-magnitude smaller than that found for ordered polycrystalline pentacene, [9] and is of the same order as the rocking widths measured for single crystals of other conjugated molecules.…”

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confidence: 58%

Solution‐Processed Thin Films of Thiophene Mesogens with Single‐Crystalline Alignment

et al. 2006

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Highly ordered thin films of organic materials are receiving a great deal of attention as active layers in a new generation of plastic electronic devices, particularly in organic field-effect transistors (OFETs).[1] Numerous organic-film preparation technologies have been tested over the past few decades. For commercial organic electronics, solution-processed, low-cost technologies such as spin-coating, inkjet printing, and screenprinting are preferred.[2] Mostly, these methods produce thin films with moderate structural order from soluble polymers and oligomers. The relevant physical parameters (e.g., chargecarrier mobilities) of thin organic films are strongly affected by the orientation, distribution, and size of the domains and domain boundaries, [3] and, more generally, by the degree of structural order. The endeavor to improve molecular alignment in active organic layers has led to the implementation of high-quality organic single crystals in OFETs with optimized performance.[4] However, recent methods for the fabrication of single-crystal devices are rather complex and inappropriate for practical applications.[5] Therefore, suitable organic compounds and preparation methods that yield highly ordered thin films are quite essential for progress in this field.In this paper, we present highly ordered thin films of 5,5″-bis(5-hexyl-2-thienylethynyl)-2,2′:5′,2″-terthiophene (TR5-C6) prepared from solution by spin-coating and subsequent thermal treatment, and studied using X-ray diffraction (XRD) techniques. The calamitic TR5-C6 molecule consists of a central terthiophene unit with acetylene linkages connecting two terminal thiophene rings with hexyl end groups (Fig. 1a).The thermotropic liquid crystalline behavior of TR5-C6 has been studied by differential scanning calorimetry (DSC), and the mesophases have been assigned by polarized optical microscopy. During cooling, exothermic phase transitions from the nematic to the smectic C phase at 115°C, from the smectic C to the smectic B phase at 109°C, and from the smectic B COMMUNICATIONS 896

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confidence: 58%

Solution‐Processed Thin Films of Thiophene Mesogens with Single‐Crystalline Alignment

et al. 2006

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“…Several studies clearly show that metal atoms can diffuse several 10 nm into an organic layer [44][45][46]. In this context, the use of alkali halides (e.g., LiF, CsF) has turned out to be very helpful in confining the organic/metal reacted region.…”

Section: Low Work Function Electrodesmentioning

confidence: 99%

Electronic structure of interfaces with conjugated organic materials

Koch

2012

Physica Rapid Research Ltrs

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The function and efficiency of most organic electronic and opto‐electronic devices greatly depend on the electronic structure of the interfaces therein. Charge injection from electrical contacts into the organic semiconductor, charge extraction, or exciton dissociation at organic semiconductor heterojunctions are crucial processes that must be optimized for high device efficiency. Consequently, the energy levels at these interfaces must be matched to allow for optimal performance. The key mechanisms that determine the energy level alignment at organic/electrode and organic/organic interfaces are reviewed, and methods to adjust the levels at such interfaces are presented. (© 2012 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

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“…The analysis of the depth profile of organic heterostructures is restricted to a few analyzing techniques like dynamic secondary ion mass spectrometry (SIMS), [2][3][4] Rutherford back scattering (RBS), [5] X-ray photoelectron spectroscopy (XPS), [6] or radiotracer measurements. [7] These methods provide information about specific atoms, possible chemical shifts and the corresponding bonding behaviour, with most of them allowing a depth resolution around 10 to 20 nm. Another way of collecting information about organic devices is the analysis of the optical constants of single organic layers [8] or simple OLEDs [9] by spectroscopic ellipsometry.…”

Section: Introductionmentioning

confidence: 99%

Analysis of Complete Organic Semiconductor Devices by Laser Desorption/Ionization Time‐of‐Flight Mass Spectrometry

Scholz

Walzer

Leo

2008

Adv Funct Materials

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In this contribution, it is shown that the method of laser‐desorption/ionization time‐of‐flight mass spectrometry (LDI‐TOF‐MS) is a powerful technique for analyzing complete organic devices, such as organic light‐emitting diodes (OLEDs) or organic solar cells. LDI‐TOF‐MS has the potential to analyze fully processed organic devices without special pretreatment such as dissolving the device, peeling off the metal cathode, or using additional matrix materials. Thus, devices may be analysed as they are with a minimum of measurement artefacts. It is demonstrated that the method allows an analysis of complex organic multilayer devices, their composition, and incorporated impurities. It even allows possible electrochemical reaction products caused by device degradation to be analyzed. Thus, LDI‐TOF‐MS has major advantages compared to measurements of dissolved samples. As an example, the identification of all of the materials used in a complete OLED is shown. Furthermore, a detailed chemical analysis of long‐term driven OLEDs, including the detection of degradation products, is presented. From these data, several degradation mechanisms can be distinguished.

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Radiotracer measurements as a sensitive tool for the detection of metal penetration in molecular-based organic electronics

Cited by 33 publications

References 18 publications

Solution‐Processed Thin Films of Thiophene Mesogens with Single‐Crystalline Alignment

Solution‐Processed Thin Films of Thiophene Mesogens with Single‐Crystalline Alignment

Electronic structure of interfaces with conjugated organic materials

Analysis of Complete Organic Semiconductor Devices by Laser Desorption/Ionization Time‐of‐Flight Mass Spectrometry

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