“…3,4,[7][8][9][10][11] RT can cause CIED malfunction from either destruction of electrical components or due to effects on CIEDs' random access memory. 1 The authors have thoroughly evaluated various irradiation parameters that might have had an impact of CIED function, including: RT type (photon / electron beam), energy, sequence, dose and fractionation, RT site (ie, the radiation target area), and its distance from the CIED with calculated estimation of the radiation dose delivered to the CIED.…”