2009
DOI: 10.1016/j.physleta.2009.07.046
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Radiographic method for measuring the continuum hard X-ray output spectrum of a Plasma Focus device

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Cited by 10 publications
(8 citation statements)
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“…Thus, higher orders of matrix D will have sufficiently low condition number, and, more details of the x-ray spectrum of the device can be measured using the radiographic method. This explains why Raspa et al resolved the x-ray spectrum of a PF device into 15 components using the radiographic method [18].…”
Section: Resultsmentioning
confidence: 99%
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“…Thus, higher orders of matrix D will have sufficiently low condition number, and, more details of the x-ray spectrum of the device can be measured using the radiographic method. This explains why Raspa et al resolved the x-ray spectrum of a PF device into 15 components using the radiographic method [18].…”
Section: Resultsmentioning
confidence: 99%
“…In recent years, the electron beam of PF devices has been used in various fields, including thin-film deposition [12][13][14], material processing [15], and lithography [1]. The interaction of electron beam with the metal anode as a hard x-ray (HXR) source has also been proposed, mostly for radiography [16][17][18][19][20] and intraoperative radiation therapy [2][3][4] applications.…”
Section: Introductionmentioning
confidence: 99%
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