2011
DOI: 10.1149/1.3581040
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Radical (HO, H and HOO) Formation and Ionomer Degradation in Polymer Electrolyte Fuel Cells

Abstract: Formation of radicals, such as HO , H and HOO , in the membrane of the polymer electrolyte fuel cell and their attack on perfluoroalkylsulfonic acid (PFSA) and poly(styrenesulfonic acid) (PSSA) ionomers was simulated based on a kinetic framework with H 2 O 2 as "parent" molecule and with contaminating Fe as parameter. Analysis under quasi-steady state conditions yielded radical concentrations of around 10 À19 M for H , 10 À16 M for HO and 10 À10 M for HOO . H is formed via the reaction of HO with H 2 dissolved… Show more

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Cited by 257 publications
(273 citation statements)
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References 103 publications
(158 reference statements)
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“…22,23 The hydroxyl radical formed is highly reactive and can attack the ionomer membrane in terms of side chain cleavage and unzipping 18,20,21,24,25 which is responsible for the deteriorated physicochemical properties observed in degraded membranes. Radical scavenging is therefore proposed to mitigate the chemical damage by quenching the radicals before they attack the ionomer membrane.…”
mentioning
confidence: 99%
“…22,23 The hydroxyl radical formed is highly reactive and can attack the ionomer membrane in terms of side chain cleavage and unzipping 18,20,21,24,25 which is responsible for the deteriorated physicochemical properties observed in degraded membranes. Radical scavenging is therefore proposed to mitigate the chemical damage by quenching the radicals before they attack the ionomer membrane.…”
mentioning
confidence: 99%
“…Fe 2+ /Fe 3+ ) greatly accelerates the decomposition of H 2 O 2 into aggressive free radicals. [6][7][8] These free radicals are known to attack PFSA membranes through an "unzipping" mechanism in which decomposition is initiated at one end of a PFSA unit and continues until complete decomposition into HF, CO 2 and low molecular weight compounds has occurred. [3][4][5]9 As a result of free radical attack, membrane thinning, and eventually complete failure (due to pinhole formation), can occur.…”
mentioning
confidence: 99%
“…Chemical degradation is linked to the attack of the weak bonds in ionomer side chains by radical species. The main type of radical species, hydroxyl radicals, is formed by the reaction of hydrogen peroxide, H 2 O 2 , at impurities such as Fe 2+ [12,13], which are present in small amounts due to the dissolution of end plates in contact with humidified oxygen and hydrogen [14][15][16]. H 2 O 2 -the main chemical compound responsible for chemical PEM degradation-is the product of surface reactions of H 2 and O 2 at PITM [17][18][19][20][21][22][23].…”
Section: Introductionmentioning
confidence: 99%
“…The net rate of H 2 O 2 formation at PITM depends on the size, shape, and distribution of Pt nanoparticles in the membrane and local reaction conditions around particles, determined by temperature, electrical potential, reactant concentrations, pH, and RH [12][13][14][15][16][17][18][24][25][26][27][28][29][30][31].…”
Section: Introductionmentioning
confidence: 99%