2023 IEEE 29th International Symposium on on-Line Testing and Robust System Design (IOLTS) 2023
DOI: 10.1109/iolts59296.2023.10224879
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Radiation Hardness Evaluations of a Stacked Flip Flop in a 22 nm FD-SOI Process by Heavy-Ion Irradiation

Shotaro Sugitani,
Ryuichi Nakajima,
Takafumi Ito
et al.
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