Radiation damage features on mica and L-valine probed by scanning force microscopy

Daya, D.D.N. Barlo; Hallén, A.; Eriksson, J.; Kopniczky, J.; Papaléo, R.; Reimann, C.T.; Håkansson, P.; Sundqvist, B.U.R.; Brunelle, A.; Della-Negra, S.; Beyec, Y. Le

doi:10.1016/b978-0-444-82334-2.50011-3

Cited by 5 publications

(8 citation statements)

References 24 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…However, tip convolution effects are not relevant whenever relative changes in the measured dimensions are involved. This was the case in many important experiments reported in the literature, such as the scalings of surface track dimensions with the stopping power, 21 ion velocity, 11 incidence angle, 20,13 and target temperature. 22 Eriksson et al 12 studied surface tracks of MeV ions on organic materials with different molecular weights, but distinct chemical structures.…”

Section: Introductionmentioning

confidence: 98%

“…5,6 The remaining material in the bulk can be strongly modified near the ion path, [7][8][9][10] but few tens of nanometers from the impact center, the deposited energy density is too low to induce significant chemical rearrangements. 10,6 In recent years, the size and shape of the surface tracks, mostly produced at grazing incidence angles, [11][12][13][14][15]4,[16][17][18][19] have been investigated with scanning force microscopy ͑SFM͒. The use of this technique allows evaluation of the total sputtering yield in single ion events 16,11 and the study of basic ion-solid interactions.…”

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Cratering and plastic deformation in polystyrene induced by MeV heavy ions: Dependence on the molecular weight

et al. 2001

View full text Add to dashboard Cite

Cratering and plastic deformation induced by individual MeV ions on the surface of polystyrene thin films of different molecular weights (M w ) ͑from 3250 to 2ϫ10 7 u) are investigated using scanning force microscopy. 20 MeV, 85 MeV and 197 MeV gold ions are used to bombard the targets at grazing incidence (79°to the surface normal͒. Induced surface tracks consist of an elliptical crater followed by a hillock elongated in the direction of the ion incidence. For a given ion energy, the crater size is largest on the lowest M w film. Crater dimensions are systematically reduced on films of heavier macro-molecules, up to a molecular weight of about 1.6ϫ10 5 u. For M w Ͼ1.6ϫ10 5 u, the crater size remains approximately constant. The difference observed for the lateral dimensions of the craters are about 50% when comparing the lowest and the highest M w films at a fixed energy. The observed saturation of the crater size for high M w values coincides with the onset of entanglement effects in the polymer, which influences the viscosity and the compliance of the material. Moreover, the curve of the crater size versus M w follows the same trend as the reciprocal viscosity ( Ϫ1 )versus M w , indicating that the viscosity is governing the final lateral dimensions of the craters. The hillock dimensions present a weak dependence on M w , above a threshold at 3250u. The different behavior observed for craters and hillocks is discussed based on the viscoelastic properties of the polymer at different M w and on the transient heating occurring close to the ion impact site.

show abstract

Section: Introductionmentioning

confidence: 98%

Section: Introductionmentioning

confidence: 99%

Cratering and plastic deformation in polystyrene induced by MeV heavy ions: Dependence on the molecular weight

et al. 2001

View full text Add to dashboard Cite

show abstract

“…The formation of huge size craters at the impact of energetic cluster ions has been reported in all kinds of targets: -observation of craters by atomic force microscopy in some inorganic materials such as mica and valine [56,57].…”

Section: Surface Deformations and Sputtering In Various Types Of Targetsmentioning

confidence: 99%

Materials Modifications with Cluster Beams: Bulk and Surface Modification

Dunlop

1999

Acta Phys. Pol. A

View full text Add to dashboard Cite

It is now well accepted that electronic excitation and ionization arising from the slowing down of swift heavy ions can lead to structural modifications in some metallic targets as it has been known for a long time in insulators. A rapid overview of some results obtained after GeV monoatomic heavy ion irradiations will be given. It will then be shown that new specific effects take place during irradiations with cluster ions. The projectiles used are energetic cluster beams: 10 to 40 MeV Au4 or C60 ions. The rates of linear energy deposition in electronic excitation are close for GeV monoatomic and for 10 MeV cluster ions, but the cluster ions have characteristic velocities which are one order of magnitude smaller than those of monoatomic ions. This leads to a strong spatial localization of the deposited energy during the slowing down process. The density of deposited energy can then reach values as high as a few 100 eV/atom. This very high density of energy deposited in the electronic system of the targets can lead to spectacular structural modifications: generation in the vicinity of the ion trajectories of isolated or agglomerated point defects, new crystalline phases, amorphized regions... After an overview of such damage induced in bulk metals, semiconductors, and insulators, we will discuss surface damage, consisting in the formation of bumps, craters, "lava-flows" on the target surface.

show abstract

“…Such X-ray and neutron experiments require typically 10 10 -10 11 ion tracks, serving as scattering centres in order to produce a signal pattern. More recently, several groups focused on the visualization of single individual tracks by applying a variety of imaging modes of scanning force microscopy (SFM) [10][11][12][13][14][15][16][17][18][19].In scanning force micrographs of high resolution, the cross-sections of latent tracks in mica appear as circular zones without any atomic order, surrounded by an intact crystalline lattice. Clearly, the material is fully amorphized within a narrow cylindrical volume along the trajectory of the heavyion projectile.…”

mentioning

confidence: 99%

mentioning

confidence: 99%

Scanning force microscopy on heavy-ion tracks in muscovite mica: track diameter versus energy loss and loading force

Ackermann

Müller

Neumann

et al. 1998

Applied Physics A: Materials Science & Processing

View full text Add to dashboard Cite

Mica is very sensitive to heavy-ion irradiation and offers an ideal surface for scanning force microscopy (SFM) of ion-induced tracks. In our work, mica samples are irradiated with heavy ions (the kinetic energies ranging from 0.5 to 2.76 GeV) at the Universal Linear Accelerator UNILAC of GSI. The cross-sections of latent ion tracks on freshly cleaved mica surfaces are imaged by lateral-force microscopy. By evaluating the statistical distribution of the track diameters, we enlarge our previously available data set of mean track diameters versus ion energy loss by two additional points for zinc and selenium. The influence of the loading force on the SFM imaging process is also addressed, in confirmation of a linear relation between apparent ion track diameters and load.In numerous solids, the passage of heavy ions with kinetic energies ranging from several hundred MeV to some GeV leads to dramatic and very rapidly developing changes to the original structure, for example the local amorphization of an insulating or semiconducting crystal along the ion trajectories. A uranium ion, to consider an extreme case, accelerated to a kinetic energy of 11.4 MeV/nucleon by the Universal Linear Accelerator UNILAC of GSI, moves over the first tens of microns of its path with about 15% of the velocity of light. At this speed, the projectile transfers its energy almost exclusively by Coulomb interaction with the electrons of the target, successively depositing energy amounts of the order of 30 keV/nm in time intervals of 2 × 10 −17 seconds.The primary processes initiating and driving the changes cannot be observed directly. However, the characteristics of the remaining, irreversibly altered zones (in the case of continuous damage trails, called "latent tracks"), such as size, shape, and internal structure, contain indirect information about these processes. Detailed studies are thus required of the dependence of track morphology and dimensions on various parameters, in particular energy loss or physical and * Permanent address: chemical material properties. A comprehensive understanding of damage formation by energetic ion projectiles can be achieved only on a long-term basis, by collecting data from many different materials and by accompanying the experimental findings with gradually refined modelling [1, 2] (and refs. therein).It was recognized early on that the mineral muscovite mica is very sensitive to irradiation with energetic heavy ions. Over several decades, ion tracks in this material have as a result been investigated with different techniques. First studies with transmission electron microscopy (TEM) [3][4][5] were followed by works on small-angle X-ray [6-9] and neutron scattering [8]. Such X-ray and neutron experiments require typically 10 10 -10 11 ion tracks, serving as scattering centres in order to produce a signal pattern. More recently, several groups focused on the visualization of single individual tracks by applying a variety of imaging modes of scanning force microscopy (SFM) [10][11][12][13][14][15][16][1...

show abstract

Radiation damage features on mica and L-valine probed by scanning force microscopy

Cited by 5 publications

References 24 publications

Cratering and plastic deformation in polystyrene induced by MeV heavy ions: Dependence on the molecular weight

Cratering and plastic deformation in polystyrene induced by MeV heavy ions: Dependence on the molecular weight

Materials Modifications with Cluster Beams: Bulk and Surface Modification

Scanning force microscopy on heavy-ion tracks in muscovite mica: track diameter versus energy loss and loading force

Contact Info

Product

Resources

About