2017
DOI: 10.1088/0256-307x/34/2/026101
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Radiation Damage Analysis of Individual Subcells for GaInP/GaAs/Ge Solar Cells Using Photoluminescence Measurements

Abstract: The radiation damage of three individual subcells for GaInP/GaAs/Ge triple-junction solar cells irradiated with electrons and protons is investigated using photoluminescence (PL) measurements. The PL spectra of each subcell are obtained using different excitation lasers. The PL intensity has a fast degradation after irradiation, and decreases as the displacement damage dose increases. Furthermore, the normalized PL intensity varying with the displacement damage dose is analyzed in detail, and then the lifetime… Show more

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Cited by 6 publications
(4 citation statements)
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“…In Figure 9 the PL spectra of the InGaAs junction, in BOL, electron-irradiation and proton-irradiation EOL, along with the related Gaussian deconvolutions are shown. In this case, the emission intensity of EOL samples is 500 times lower than that of BOL sample, in agreement with the literature [36]: this confirms the very higher sensitivity to irradiation of the InGaAs junction with respect to the InGaP one.…”
Section: Results: Photoluminescence Spectrasupporting
confidence: 92%
“…In Figure 9 the PL spectra of the InGaAs junction, in BOL, electron-irradiation and proton-irradiation EOL, along with the related Gaussian deconvolutions are shown. In this case, the emission intensity of EOL samples is 500 times lower than that of BOL sample, in agreement with the literature [36]: this confirms the very higher sensitivity to irradiation of the InGaAs junction with respect to the InGaP one.…”
Section: Results: Photoluminescence Spectrasupporting
confidence: 92%
“…[1][2][3] With the development of laser processing technology, the use of lasers for punching, slotting and scribing germanium has also become a reality. [4][5][6][7][8] Compared with millisecond lasers, short-pulse lasers such as femtosecond and picosecond lasers have superior processing quality. However, the laser energy is easily shielded due to the plasma produced by the high power density, thus reducing the efficiency of the process.…”
Section: Introductionmentioning
confidence: 99%
“…We have investigated the electron damage effects on the minority carrier lifetime in GaInP/GaAs/Ge 3J solar cells, and the values of the lifetime damage coefficient of the recombination centers have been obtained. [4] For electron irradiated GaInP/GaAs/Ge 3J solar cells, the degradation of performance is mainly dominated by the GaInP top cell and the GaAs middle cell, and the Ge bottom cell has negligible effects on the triple-junction solar cells performance. [5] To further evaluate the degradation behavior of the 3J solar cells, it is essential to investigate the electron damage of minority carrier diffusion length in the GaInP top cell and the GaAs middle cell.…”
mentioning
confidence: 99%