1982
DOI: 10.21236/ada118839
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RADC Thermal Guide for Reliability Engineers.

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Cited by 12 publications
(5 citation statements)
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“…It is known that a 10-20°C increase in chip temperature can sometimes double the failure rate of the components. 3 In this study, we observed an asymmetrical thermal behavior of the doped Si channels under high current density stress. Thermal and electrical characterization of the doped Si channels was conducted.…”
Section: Introductionmentioning
confidence: 63%
“…It is known that a 10-20°C increase in chip temperature can sometimes double the failure rate of the components. 3 In this study, we observed an asymmetrical thermal behavior of the doped Si channels under high current density stress. Thermal and electrical characterization of the doped Si channels was conducted.…”
Section: Introductionmentioning
confidence: 63%
“…Those cases are collected in different domains such as computer chassis, avionic facilities. The examples of the flow guidelines are as follows [6,7]:…”
Section: Qualitative Guidelinesmentioning
confidence: 99%
“…As the velocity increased, the static pressure will decrease. High air velocity can result in such a low static pressure at the inlet [6]. When a flow reversal happens, the hot air will then be drawn in from the exit plenum.…”
Section: Qualitative Guidelinesmentioning
confidence: 99%
“…Two important non-automated thermal design resources which designers should be familiar with are References (21 and (3]. As engineers attempt to design devices that operate at higher frequencies and that are smaller, more efficient, precise, sensitive and reliable, while being less expensive, the need to reckon with field electromagnetic effects grows steadily in importance.…”
Section: Tmentioning
confidence: 99%