2001
DOI: 10.1103/physrevb.63.205405
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Quenching of capillary waves in composite wetting films from a binary vapor: An x-ray reflectivity study

Abstract: We report x-ray reflectivity measurements of the internal structure of thin wetting films formed on a silicon substrate from the vapor of a binary mixture of methylcyclohexane ͑MC͒ and perfluoromethylcyclohexane ͑PF͒. At Tϭ30°C ͑below the bulk consolute temperature of T c Ϸ46°C) variation in the difference in temperature between the substrate and the vapor induces changes in film thickness ͑25 to 135 Å) that are consistent with complete wetting of both surfaces, with a MC-rich phase wetting the substrate and a… Show more

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Cited by 27 publications
(46 citation statements)
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“…This thickness dependent surface roughness of the film can be explained by the van der Waals interaction between the liquid water substrate and the propane layer which affects the capillary wave induced surface roughness of the liquid layer [18,23]. The thickness dependent capillary wave roughness of the adsorbed layer can be calculated using a theory described in [31] which is based on a Taylor expansion of the interfacial potential.…”
Section: Data Analysis and Discussionmentioning
confidence: 99%
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“…This thickness dependent surface roughness of the film can be explained by the van der Waals interaction between the liquid water substrate and the propane layer which affects the capillary wave induced surface roughness of the liquid layer [18,23]. The thickness dependent capillary wave roughness of the adsorbed layer can be calculated using a theory described in [31] which is based on a Taylor expansion of the interfacial potential.…”
Section: Data Analysis and Discussionmentioning
confidence: 99%
“…The wave vector transfer has only one component which is given by q z = (4π/λ) sin α, where λ denotes the wavelength of the radiation and α the angle between the surface and the x-ray beam. A general description of the x-ray reflectivity technique is given in [18][19][20][21][22][23]. Assuming a simple model consisting of two rough interfaces, i.e.…”
Section: Theory Of X-ray Reflectivitymentioning
confidence: 99%
“…1) with nearest neighbor distances (center to center) of 58±4 nm, and diameter of 21 ± 5 nm, determined via electron microscopy. After cleaning, samples were dried and loaded into a hermetically sealed environmental chamber under an atmosphere of "ultra-pure" grade N 2 .The environmental chamber as described elsewhere [4,12,15], consisted of two concentric cylindrical metal chambers that allowed extremely stable (drift of < 5 mK/hr) temperature control of the sample with a precision of ±1 mK. Condensation of liquid solvent into the pores was precisely controlled via a positive offset ∆T between the sample temperature, T s and the temper-…”
mentioning
confidence: 99%
“…[4,12,15] Here, H vap = 33.9 kJ/mol is the heat of vaporization of PFMC. [18] For large ∆T , little or no liquid condenses in the pores.…”
mentioning
confidence: 99%
“…Liquid surfaces also provide a unique opportunity to study wetting phenomena on a structure less substrate [4,5]. Specifically they provide a unique opportunity to study the evolution of the liquid -liquid interface as one of the liquids evolves from a thin 2D wetting layer to the bulk liquid [6].…”
mentioning
confidence: 99%