2020
DOI: 10.1038/s41467-020-14379-w
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Quasiparticle tunnel electroresistance in superconducting junctions

Abstract: The term tunnel electroresistance (TER) denotes a fast, non-volatile, reversible resistance switching triggered by voltage pulses in ferroelectric tunnel junctions. It is explained by subtle mechanisms connected to the voltage-induced reversal of the ferroelectric polarization. Here we demonstrate that effects functionally indistinguishable from the TER can be produced in a simpler junction scheme-a direct contact between a metal and an oxide-through a different mechanism: a reversible redox reaction that modi… Show more

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Cited by 22 publications
(42 citation statements)
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“…Those features are reminiscent of the conductance decrease/increase observed for ejV BIAS j < Δ in superconducting-normal-metal junctions depending on the interface transparency [31]. However, here they extend over a bias range δ exp that clearly exceeds the superconducting energy gap expected for moderately underdoped to optimally doped YBCO, which is reported in the range Δ YBCO ∼ 15-30 meV [32][33][34][35]. Furthermore, details such as the sharp zero-bias peak observed for some devices (see, e.g., B4D and E3D in the Supplemental Material [36]) are characteristic of junctions involving dwave superconductors, and appear when the d-wave nodes form a certain angle with respect to the junction interface [33,37,38].…”
mentioning
confidence: 50%
“…Those features are reminiscent of the conductance decrease/increase observed for ejV BIAS j < Δ in superconducting-normal-metal junctions depending on the interface transparency [31]. However, here they extend over a bias range δ exp that clearly exceeds the superconducting energy gap expected for moderately underdoped to optimally doped YBCO, which is reported in the range Δ YBCO ∼ 15-30 meV [32][33][34][35]. Furthermore, details such as the sharp zero-bias peak observed for some devices (see, e.g., B4D and E3D in the Supplemental Material [36]) are characteristic of junctions involving dwave superconductors, and appear when the d-wave nodes form a certain angle with respect to the junction interface [33,37,38].…”
mentioning
confidence: 50%
“…and multiferroic tunnel junctions, [6][7][8][9][10][11] in the improvement of photovoltaic devices for clean power generation, [12][13][14][15][16] and in the implementation of memristors for neuromorphic computing. [17][18][19][20] Most of these research relies on high quality thin film FEs, which benefitted from the great development of growth techniques in the last decades.…”
Section: Doi: 101002/aelm202100069mentioning
confidence: 99%
“…Very recently, the redox processes with oxygen exchange at interfaces have been put forward to explain TER effects. [26] In any capacitive structure with a dielectric barrier, the incomplete screening of the charges at the interfaces, will act on the electrostatic potential overall profile. [13,[27][28] As a result, the reversal of an applied electric field will generate two distinct barrier profiles for the transport of electrons, inducing the ER effect.…”
Section: Introductionmentioning
confidence: 99%
“…Very recently, the redox processes with oxygen exchange at interfaces have been put forward to explain TER effects. [ 26 ]…”
Section: Introductionmentioning
confidence: 99%