2013
DOI: 10.1063/1.4773589
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Quantum Hall transport as a probe of capacitance profile at graphene edges

Abstract: The quantum Hall effect is a remarkable manifestation of quantized transport in a two-dimensional electron gas. Given its technological relevance, it is important to understand its development in realistic nanoscale devices. In this work we present how the appearance of different edge channels in a field-effect device is influenced by the inhomogeneous capacitance profile existing near the sample edges, a condition of particular relevance for graphene. We apply this practical idea to experiments on high qualit… Show more

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Cited by 25 publications
(44 citation statements)
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“…Enhanced conductance can also arise due to electric field focusing at the sample edges [39]. This effect may be particularly relevant for top gates deposited after etching, resulting in conformal coverage of the etched walls.…”
Section: Discussionmentioning
confidence: 99%
“…Enhanced conductance can also arise due to electric field focusing at the sample edges [39]. This effect may be particularly relevant for top gates deposited after etching, resulting in conformal coverage of the etched walls.…”
Section: Discussionmentioning
confidence: 99%
“…Therefore, we have to point out that the linear scaling will hold as well for a leverage factor of 1.1 × 10 10 cm −2 V −1 if we assume ν = 4 and 2 as the observed sequence of plateaus. From previous studies 29 we know that the capacitance probed by the quantum Hall effect (QHE) in graphene devices (especially in suspended samples) can be higher than the geometrical value, due to the deviation from the plane capacitor model. However, we attribute the observed plateaus to the filling factors 2 and 1.…”
Section: Temperature Dependence and Quantum Transportmentioning
confidence: 99%
“…21 the increase in capacitance of the system under the applied magnetic field could be understood from the deviation from the flat-plate capacitor model. At the point when the width of the graphene flake is smaller or comparable to the distance to the back gate the flatplate capacitor model can no longer be applied.…”
Section: Appendixmentioning
confidence: 99%
“…The geometrical gate capacitance is given by a combination of the vacuum gap (1.15 μm) and SiO 2 substrate (0.5 μm). Using a serial capacitor model we calculate a gate capacitance of 7.2 aF/μm −2 which directly relates the carrier concentration to V G as n = α(V G − V CNP ) with leverage factor α = 0.5 × 10 14 m −2 V −1 and a finite voltage of the the CNP of V CNP = 1.2 V. In high magnetic fields, the geometric capacitance increases due to the formation of edge states 21 and α becomes dependent on B. Therefore, the exact values of capacitance were determined experimentally by identifying the filling factors of quantized Hall plateaus in magnetic field; details can be found in the appendix.…”
Section: Experimental Backgroundmentioning
confidence: 99%