1999
DOI: 10.1016/s0038-1098(99)00354-3
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Quantum defect approach for the effect of electron–phonon coupling on impurity recombination in semiconductors

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Cited by 25 publications
(31 citation statements)
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“…We cannot do any accurate model because many physical parameters are lacking. But we can remember that the strength of coupling with LO-phonons for DAP is simply a growing function of the average distance R between donor and acceptor ions [41]. This is exactly what we have observed, a minimum for R being simply the distance between localization centers along the growth axis, i.e.…”
Section: Electric Field Versus Localizationsupporting
confidence: 74%
“…We cannot do any accurate model because many physical parameters are lacking. But we can remember that the strength of coupling with LO-phonons for DAP is simply a growing function of the average distance R between donor and acceptor ions [41]. This is exactly what we have observed, a minimum for R being simply the distance between localization centers along the growth axis, i.e.…”
Section: Electric Field Versus Localizationsupporting
confidence: 74%
“…(1) and (3) that S generally depends strongly on the spatial separation of the electron and hole charge densities [3,17]. In the present case of nitride-based heterostructures, this spatial separation along the z-axis is enhanced by the internal electric field.…”
Section: Experimental and Theoretical Resultsmentioning
confidence: 79%
“…a growing function of the well width. In the case of real DAPs, this dependence can be calculated [17] by variational methods, provided that correct shapes of wave-functions are included. For the present system of potential fluctuations, too many physical parameters are unknown to justify any reliable choice for such trial functions.…”
Section: Experimental and Theoretical Resultsmentioning
confidence: 99%
“…This is consistent with the lower Huang-Rhys parameter for more closely spaced donoracceptor pairs. [48] Carbon is particularly problematic because it is the only impurity inherent in MOCVD growth of GaAs, arising as a decomposition product of TMG. [45] Other impurities such as Si and Zn can be eliminated using high purity precursor sources.…”
Section: Photoluminescencementioning
confidence: 99%