2013
DOI: 10.1364/oe.21.004155
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Quantitative X-ray phase-contrast computed tomography at 82 keV

Abstract: Potential applications of grating-based X-ray phase-contrast imaging are investigated in various fields due to its compatibility with laboratory X-ray sources. So far the method was mainly restricted to X-ray energies below 40 keV, which is too low to examine dense or thick objects, but a routine operation at higher energies is on the brink of realisation. In this study, imaging results obtained at 82 keV are presented. These comprise a test object consisting of well-defined materials for a quantitative analys… Show more

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Cited by 59 publications
(65 citation statements)
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“…the electron density) is represented in both contrast modalities. However, the experimental setup has been successfully designed to provide enhanced, in the form of higher contrast-to-noise ratios, phase-contrast images as compared to the attenuation-contrast results, hereby confirming the experimental findings from the monochromatic case by Willner et al [5]. This contrast gain depends strongly on the specific grating interferometer and its optical parameters.…”
Section: Discussionsupporting
confidence: 83%
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“…the electron density) is represented in both contrast modalities. However, the experimental setup has been successfully designed to provide enhanced, in the form of higher contrast-to-noise ratios, phase-contrast images as compared to the attenuation-contrast results, hereby confirming the experimental findings from the monochromatic case by Willner et al [5]. This contrast gain depends strongly on the specific grating interferometer and its optical parameters.…”
Section: Discussionsupporting
confidence: 83%
“…The more the attenuation process results from the Compton effect, the more the attenuation-based image is proportional to the electron density, as is also the case in the phase contrast. No additional information on the material composition can be gained if attenuation is mostly attributed to Compton scattering [5]. Thus, for all low-Z materials we expect similar contrast differences for attenuation and phase contrast images at high X-ray energies.…”
Section: Contrast Dependence / Formationmentioning
confidence: 90%
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