Quantitative x-ray magnetic circular dichroism mapping with high spatial resolution full-field magnetic transmission soft x-ray spectro-microscopy

Robertson, MM; Agostino, Christopher J.; N’Diaye, Alpha T.; Chen, Gong; Im, Mi‐Young; Fischer, Peter

doi:10.1063/1.4918691

Cited by 8 publications

(6 citation statements)

References 17 publications

(12 reference statements)

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“…Recent developments with TXM aim to retrieve quantitative spectroscopic information over much larger areas in naturally heterogeneous systems. To that end, the domain pattern in a multilayered (Co 0.3 nm/Pt 0.5 nm) × 30 thin film exhibiting a strong perpendicular magnetic anisotropy was studied [102]. MTXM images were recorded over an energy range from 725-805 eV in steps of 0.5 eV covering both the preedge region as well as the L 3 and L 2 resonant x-ray absorption edges at 778.1 eV and 793.2 eV, resp.…”

Section: Multiscale Spatial and Temporal Approachesmentioning

confidence: 99%

X-rays and magnetism

Fischer

Ohldag

2015

Rep. Prog. Phys.

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Magnetism is among the most active and attractive areas in modern solid state physics because of intriguing phenomena interesting to fundamental research and a manifold of technological applications. State-of-the-art synthesis of advanced magnetic materials, e.g. in hybrid structures paves the way to new functionalities. To characterize modern magnetic materials and the associated magnetic phenomena, polarized x-rays have emerged as unique probes due to their specific interaction with magnetic materials. A large variety of spectroscopic and microscopic techniques have been developed to quantify in an element, valence and site-sensitive way properties of ferro-, ferri-, and antiferromagnetic systems, such as spin and orbital moments, and to image nanoscale spin textures and their dynamics with sub-ns time and almost 10 nm spatial resolution. The enormous intensity of x-rays and their degree of coherence at next generation x-ray facilities will open the fsec time window to magnetic studies addressing fundamental time scales in magnetism with nanometer spatial resolution. This review will give an introduction into contemporary topics of nanoscale magnetic materials and provide an overview of analytical spectroscopy and microscopy tools based on x-ray dichroism effects. Selected examples of current research will demonstrate the potential and future directions of these techniques.

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Section: Multiscale Spatial and Temporal Approachesmentioning

confidence: 99%

X-rays and magnetism

Fischer

Ohldag

2015

Rep. Prog. Phys.

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“…A recent magnetic x-ray transmission spectromicroscopy study performed with a multilayered (Co 0.3 nm/Pt 0.5 nm) x 30 heterostructure across the Co L 3 and L 2 edges has shown a reduced L 3 /L 2 XMCD signal, which could be explained by a spin texture inside the domain wall, that would be much more complex than the commonly assume Bloch wall [80]. To experimentally verify this hypothesis, a full 3D tomographic characterization of the internal spin texture is needed.…”

Section: Towards Fundamental Magnetic Length Scalesmentioning

confidence: 99%

Magnetic imaging with polarized soft x-rays

Fischer

2017

J. Phys. D: Appl. Phys.

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Properties, behavior, and functionalities of magnetic materials are largely determined by microscopic spin textures, particularly their formation into domains, their coupling mechanisms and their dynamic behavior. Advanced characterization tools are prerequisite to fundamentally understand magnetic materials and control spins for novel magnetic applications. Magnetic microscopies allow to image directly the static and dynamic features of the relevant microscopic magnetization structures in advanced magnetic materials and thus provide detailed and direct insight into underlying physical phenomena. A large variety of magnetic imaging techniques has become available with particular strengths but also certain limitations.Essential features of magnetic microscopies are a high spatial resolution down into the nanometer regime, as this is the fundamental length scale of magnetic exchange interaction and the ultimate length scale in advanced magnetic technologies; magnetic and elemental sensitivity with quantitative capabilities, as the properties of advanced magnetic materials can be tailored by combining various magnetic elements and their magnetic moments; high temporal resolution from the nsec to the fsec regime to understand the associated spin dynamic processes and the functionality in magnetic devices; tomographic capabilities with nm resolution as new directions in nanoscience and technologies are moving into 3dim arrangements of spin structures; and interfacial sensitivity as novel ways to control spins harness either the coupling across interfaces in multilayered structures or utilize non-collinear spin arrangements, which often occur from symmetry breaking at surfaces and interfaces.The unique properties of polarized soft x-rays, their abundancy and specific interaction with magnetic materials in form of dichroism effects have triggered the development of various magnetic x-ray imaging techniques. This review will provide an overview of the current state-of-the-art in magnetic imaging with polarized soft x-rays. It describes the various approaches using x-ray optics, electron optics and diffraction based techniques and it will highlight the capabilities of each technique by selected examples from current research.

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“…Additionally, once the patterned elements with 3D magnetic configuration have been obtained, it is necessary to perform their appropriate characterization. In this sense, among other methods, Magnetic Transmission X-ray Microscopy (MTXM) has been shown to be a suitable technique to analyse the magnetic structure, as it provides a high spatial resolution of the sample, as well as element-specific magnetic information [8]. In addition, the data acquired with MTXM can be later processed by tomographic methods in order to obtain a magnetic tomographic reconstruction, which can allow us to resolve the threedimensional magnetization within the sample volume [9].…”

Section: Introductionmentioning

confidence: 99%

Two-Step Resist Deposition of E-Beam Patterned Thick Py Nanostructures for X-ray Microscopy

et al. 2022

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Patterned elements of permalloy (Py) with a thickness as large as 300 nm have been defined by electron beam lithography on X-ray-transparent 50 nm thick membranes in order to characterize their magnetic structure via Magnetic Transmission X-ray Microscopy (MTXM). To avoid the situation where the fragility of the membranes causes them to break during the lithography process, it has been found that the spin coating of the resist must be applied in two steps. The MTXM results show that our samples have a central domain wall, as well as other types of domain walls, if the nanostructures are wide enough.

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Quantitative x-ray magnetic circular dichroism mapping with high spatial resolution full-field magnetic transmission soft x-ray spectro-microscopy

Cited by 8 publications

References 17 publications

X-rays and magnetism

X-rays and magnetism

Magnetic imaging with polarized soft x-rays

Two-Step Resist Deposition of E-Beam Patterned Thick Py Nanostructures for X-ray Microscopy

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