Quantitative trait loci for resistance to spot blotch caused by Bipolaris sorokiniana in wheat (T. aestivum L.) lines ‘Ning 8201’ and ‘Chirya 3’

Kumar, Uttam; Joshi, Arun Kumar; Kumar, Sundeep; Chand, Ramesh; Röder, Marion S.

doi:10.1007/s11032-009-9388-2

Cited by 75 publications

(94 citation statements)

References 27 publications

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“…These hot spot regions of QTL could carry the genetic information about relation between morpho-physiological and yield-related traits under heat-stressed environments. The presence of pleiotropic/co-localized QTLs and their importance has been reported in wheat for different traits (Kumar et al 2010;Vijayalakshmi et al 2010) including heat-stress-related traits (Mason et al 2010(Mason et al , 2011Pinto et al 2010). According to Yang et al (2007a, b), the common QTL can be a result of: (a) two strongly linked genes affecting different traits; (b) a single gene that can produce a number of effects in related traits; (c) one gene governing two or more independent traits; and (d) two linked genes that affect the same traits.…”

Section: Discussionmentioning

confidence: 99%

QTL mapping of terminal heat tolerance in hexaploid wheat (T. aestivum L.)

et al. 2012

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High temperature (>30 °C) at the time of grain filling is one of the major causes of yield reduction in wheat in many parts of the world, especially in tropical countries. To identify quantitative trait loci (QTL) for heat tolerance under terminal heat stress, a set of 148 recombinant inbred lines was developed by crossing a heat-tolerant hexaploid wheat (Triticum aestivum L.) cultivar (NW1014) and a heat-susceptible (HUW468) cultivar. The F(5), F(6), and F(7) generations were evaluated in two different sowing dates under field conditions for 2 years. Using the trait values from controlled and stressed trials, four different traits (1) heat susceptibility index (HSI) of thousand grain weight (HSITGW); (2) HSI of grain fill duration (HSIGFD); (3) HSI of grain yield (HSIYLD); and (4) canopy temperature depression (CTD) were used to determine heat tolerance. Days to maturity was also investigated. A linkage map comprising 160 simple sequence repeat markers was prepared covering the whole genome of wheat. Using composite interval mapping, significant genomic regions on 2B, 7B and 7D were found to be associated with heat tolerance. Of these, two (2B and 7B) were co-localized QTL and explained more than 15 % phenotypic variation for HSITGW, HSIGFD and CTD. In pooled analysis over three trials, QTL explained phenotypic variation ranging from 9.78 to 20.34 %. No QTL × trial interaction was detected for the identified QTL. The three major QTL obtained can be used in marker-assisted selection for heat stress in wheat.

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Section: Discussionmentioning

confidence: 99%

QTL mapping of terminal heat tolerance in hexaploid wheat (T. aestivum L.)

et al. 2012

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“…Resistance to spot blotch in wheat behaves like a Quantitative trait (Joshi et al, 2004b), but until recently little has been known about its genetics and observed that wheat genotypes expressing leaf tip necrosis (LTN) in general showed less spot blotch symptoms and demonstrated a genetic association between this phenotypic marker and spot blotch resistance in a segregating population. Quantitative trait loci (QTLs) for resistance have recently been mapped in the resistance sources 'Yangmai#6' (Kumar et al, 2009), 'Ning 8201' and 'Chirya-3' (Kumar et al, 2010).…”

Section: Issn: 2320-5407mentioning

confidence: 99%

Screening of Resistance Source Against Spot Blotch Disease Caused by Bipolaris Sorokiniana in Triticum Aestivum L.

Ojha¹,

Singh²,

Tyagi³

et al. 2017

IJAR

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“…Moderate (0.58-0.62) to high (0.71-0.72) heritability estimates of SB resistance have been reported, indicating the effectiveness of selection for this trait in segregating populations generated from parents with different resistance levels (Sharma and Duveiller 2003;Joshi et al 2004;Kumar et al 2009Kumar et al , 2010. It was also suggested that selection for this trait should be done in advanced generations in order to accumulate minor resistance genes (Dubin and Rajaram 1996;Joshi et al 2004).…”

Section: Introductionmentioning

confidence: 99%

“…However, the related research has been limited and thus no marker assisted selection (MAS) has been done in this regard, due to a lack of closely linked markers (Sharma et al 1997;Das et al 2002;Kumar et al 2005Kumar et al , 2009Kumar et al , 2010Makandar and Prabhu 2009). Nevertheless, a recent report indicated that two rust resistant genes, Lr34 and Lr46, confer also SB resistance in a CIMMYT breeding line Saar (Lillemo et al 2013), indicating the potential value of these two genes along with their associated morphological marker (leaf tip necrosis, LTN) in MAS.…”

Section: Introductionmentioning

confidence: 99%

Development and characterization of the 4th CSISA-spot blotch nursery of bread wheat

Singh

Yong

et al. 2015

Eur J Plant Pathol

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Spot blotch (SB) caused by Cochliobolus sativus is a serious biotic stress to wheat in warm and humid areas, particularly South Asia (SA). In order to support South Asian farmers to combat SB, International Maize and Wheat Improvement Center (CIMMYT) established an efficient SB screening system at Agua Fria, Mexico and developed a nursery under the project -Cereal Systems Initiative for South Asia (CSISA). The materials used to form CSISA-SB nursery were selected from advanced breeding lines from different wheat breeding programs at CIMMYT. Seed of CSISA-SB nursery was produced at diseasefree plots at El Batan and Mexicali, and distributed to SA after rigorous seed health checks. The 4th CSISA-SB, made available in 2012, comprised 50 entries including two resistant and two susceptible checks. The nursery was evaluated in seven locations in Mexico, India, and Bangladesh in the 2012-13 cropping season. The results indicated that although few lines exhibited stable resistance across locations due to strong G × E interaction, promising lines with SB resistance and good agronomy can still be identified in each location. The two most promising lines showing consistent spot blotch resistance across the regions were CHUKUI#1 (CIMMYT germplasm bank identification number, GID 6178575) and VAYI#1 (GID 6279248). These lines Eur J Plant Pathol (2015) 143:595-605 could be promoted as sources of SB resistance or directly released as cultivars in SA.

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Quantitative trait loci for resistance to spot blotch caused by Bipolaris sorokiniana in wheat (T. aestivum L.) lines ‘Ning 8201’ and ‘Chirya 3’

Cited by 75 publications

References 27 publications

QTL mapping of terminal heat tolerance in hexaploid wheat (T. aestivum L.)

QTL mapping of terminal heat tolerance in hexaploid wheat (T. aestivum L.)

Screening of Resistance Source Against Spot Blotch Disease Caused by Bipolaris Sorokiniana in Triticum Aestivum L.

Development and characterization of the 4th CSISA-spot blotch nursery of bread wheat

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