1997
DOI: 10.1107/s0021889897000186
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Quantitative Texture Analysis from X-ray Diffraction Spectra

Abstract: A method to obtain the orientation distribution function (ODF) of a polycrystalline material directly from X-ray diffraction spectra is presented. It uses the maximumtexture-entropy assumption to reduce the diffraction data needed for the ODF analysis. The validity of this new method is illustrated through two model examples.

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Cited by 7 publications
(4 citation statements)
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“…The orientation distribution functions (ODFs) were determined by the modified maximum entropy method from the three measured pole figures. [11,12] …”
Section: Materials and Experimental Proceduresmentioning
confidence: 98%
“…The orientation distribution functions (ODFs) were determined by the modified maximum entropy method from the three measured pole figures. [11,12] …”
Section: Materials and Experimental Proceduresmentioning
confidence: 98%
“…(1) We first obtained the experimental and theoretical structural factors from the GSAS software by the LeBail extraction. (2) A modified maximum entropy method algorithm [15] was used to construct the inverse pole figures (IPFs) along the LD and RD from the experimental and theoretical structural factors. Thus, the grain-orientation distributions of polycrystalline Ni-Mn-Ga specimens with different thermomechanical treatment histories are quantitatively determined.…”
Section: B Preferred Distribution Of Parent Phase and Martensitic Vamentioning
confidence: 99%
“…A modi®ed maximum entropy method algorithm (Wang et al, 1997) was used to construct the CODF from the intensity factors obtained from the least-squares ®tting and calibrated using the iron powder sample. During the processing of the texture data, the differences in angular acceptance by different detector banks were also considered.…”
Section: Analysis Of the Texturementioning
confidence: 99%