Quantitative structural analysis of organic thin films: An x-ray diffraction study

Miller, Casey W.; Sharoni, Amos; Liu, G.; Colesniuc, Corneliu N.; Frühberger, Bernd; Schuller, Iván K.

doi:10.1103/physrevb.72.104113

Cited by 64 publications

(57 citation statements)

References 47 publications

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“…13,14 In order to obtain ␣-phase FePc films with the molecule plane parallel to the sapphire substrate, first a 40 nm nominal thickness Au buffer layer was deposited at a rate of 0.3 Å / s. This buffer layer was annealed for one hour at 300°C "in situ" to remove any water from the surface and to smoothen the Au surface. Without breaking vacuum, the FePc was deposited from a crucible set to 350°C, while the substrate was maintained at 150°C to increase the crystallite size.…”

Section: Methodsmentioning

confidence: 99%

“…Atomic force microscopy and x-ray diffraction proved that the samples consist of textured columnar grains with a random distribution of the molecular x and y axes parallel to the substrate plane and a small mosaic spread in the z direction. 13 In the XLPA experiments the polarization of E ជ is denoted as horizontal ͑H͒ and vertical ͑V͒ for parallel and perpendicular to the storage ring electron orbit plane, respectively.…”

Section: Film Morphologymentioning

confidence: 99%

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Highly unquenched orbital moment in textured Fe-phthalocyanine thin films

et al. 2010

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X-ray magnetic circular dichroism ͑XMCD͒ measured at T = 6 K and 0 H = 5 T on the ␣-phase Fephthalocyanine ͑FePc͒ textured thin films shows that the Fe 2+ ions present an unusually large, highly unquenched m L = 0.53Ϯ 0.04 B orbital component, with planar anisotropy. The spin m S = 0.64Ϯ 0.05 B and the intra-atomic magnetic dipolar m T components were also obtained. The m L / m S = 0.83 ratio is the largest measured in 3d complexes and compounds. The origin of this unusually high orbital moment is the incompletely filled e g level lying close to the Fermi energy. This explains the unusually large and positive hyperfine field detected by Mössbauer spectroscopy in FePc. The FePc film strong planar anisotropy inferred from XMCD experiments is fully confirmed by magnetization measurements.

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Section: Methodsmentioning

confidence: 99%

Section: Film Morphologymentioning

confidence: 99%

Highly unquenched orbital moment in textured Fe-phthalocyanine thin films

et al. 2010

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“…[10,11]). The FePc molecules on the film lie parallel to the Au/sapphire substrate and stacked in chains (see inset in Fig.…”

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confidence: 99%

Quadrupolar XMCD at the FeK-edge in Fe phthalocyanine film on Au: Insight into the magnetic ground state

Bartolomé

Figueroa

et al. 2015

Phys. Rev. B

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“…The influence of different deposition conditions on both, the preferred orientation of FePc crystallites within films and surface morphology was investigated using X-ray diffraction method [18]. The morphology of thin film surface depends also decisively on sample preparation conditions.…”

Section: Introductionmentioning

confidence: 99%

Orientation study of iron phthalocyanine (FePc) thin films deposited on silicon substrate investigated by atomic force microscopy and micro-Raman spectroscopy

Szybowicz

Makowiecki

2011

J Mater Sci

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In this article, we present temperature and orientation study of iron phthalocyanine (FePc) thin films with different thickness deposited on silicon substrate. The organic thin films were obtained by the quasi-molecular beam evaporation. The micro-Raman scattering spectra of FePc thin layers were investigated in the spectral range 550-1,800 cm -1 using 488-nm excitation wavelength. The Raman scattering and atomic force microscopy studies were performed at room temperature before and after annealing process. Annealing process of thin layers was carried out at 453 K for 6 h. From polarized Raman spectra using surface Raman mapping procedure the information on distribution of polymorphic phases of FePc layers has been carried out. Moreover, the obtained results showed the influence of the annealing process on the ordering of the molecular structure of thin films deposited on silicon substrate. For the very thin layers we did not observe the change of the polymorphic phase but only reordering of the thin layers and change of molecular structure to intermediate phase. Using atomic force microscopy method, we observed arrangement of the thin layers structure connected with the change of roughness of the thin layers after annealing process. The obtained results indicate that the structure of thin layer deposited on silicon substrate is strongly affected by the annealing process.

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Quantitative structural analysis of organic thin films: An x-ray diffraction study

Cited by 64 publications

References 47 publications

Highly unquenched orbital moment in textured Fe-phthalocyanine thin films

Highly unquenched orbital moment in textured Fe-phthalocyanine thin films

Quadrupolar XMCD at the FeK-edge in Fe phthalocyanine film on Au: Insight into the magnetic ground state

Orientation study of iron phthalocyanine (FePc) thin films deposited on silicon substrate investigated by atomic force microscopy and micro-Raman spectroscopy

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