Quantitative structural analysis of individual nanotubes by electron diffraction

Zuo, Jian‐Min; Kim, T.; Celik-Aktas, Ayten; Tao, Jing

doi:10.1524/zkri.2007.222.11.625

Cited by 18 publications

(19 citation statements)

References 25 publications

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“…For example, fitting the ͑10͒ layer line of the ͑19,11͒ tube by a single Bessel function gave N = 23 instead of N = 19 that was expected for a circular tube and a diameter of 2.32 nm instead of 2.05 nm. Thus, ED methods previously developed for cylindrical nanotubes 16,19,30 will fail for deformed nanotubes observed here.…”

Section: I͑rn/p͒mentioning

confidence: 94%

“…To compare with theory, the tube tilting angle ͑␥͒ relative to the electron beam was measured from the DP. 16,19 We used ␥ = 7.3°obtained by fitting layer lines of ͑01͒ and ͑11͒ of the ͑17,5͒ tube, which are less sensitive to deformation according to our simulations. The layer line ͑11͒ is very sensitive to small changes in ␥.…”

Section: I͑rn/p͒mentioning

confidence: 99%

“…An analysis of the diffraction pattern ͑DP͒ based on cylindrical tubes was carried out following the procedures described in Ref. 16. The positions of the layer lines were used to measure the tube chiral angle ͑␣ E ͒, which gives ͑a͒ ␣ E = 12.59°and ͑b͒ ␣ E = 21.23°with an error bar of 0.10°.…”

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confidence: 99%

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Measurement of radial deformation of single-wall carbon nanotubes induced by intertube van der Waals forces

et al. 2008

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A cylindrical single-wall carbon nanotube ͑SWCNT͒ deforms in a nanotube bundle by van der Waals forces. The deformation is hard to measure, but is required in order to understand the properties of bundles. Here, we show that such deformations can be measured from changes in electron diffraction intensities. We demonstrate this for a bundle of two SWCNTs ͑d = 2.05 and 1.56 nm͒. Deformation model predicted by atomistic simulations is scaled to fit the experiment. We show that the best fit gives flattening values of 0.7 and 0.35 Å at the middle of the binding surface for the two SWCNTs.

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Section: I͑rn/p͒mentioning

confidence: 94%

Section: I͑rn/p͒mentioning

confidence: 99%

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Measurement of radial deformation of single-wall carbon nanotubes induced by intertube van der Waals forces

et al. 2008

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“…Here we report a general electron diffraction procedure for study of C-C bonds in MWCNTs. The analysis method is based on the layer line fitting method reported in [3].The MWCNTs studied here were synthesized by chemical vapor deposition (CVD) obtained from NANOCYL Company (France). Electron diffraction patterns were recorded from individual MWCNTs in the NED mode using the JEOL 2010F transmission electron microscope (TEM) with a field emission gun at 200 kV installed at University of Illinois.…”

mentioning

confidence: 99%

“…Here we report a general electron diffraction procedure for study of C-C bonds in MWCNTs. The analysis method is based on the layer line fitting method reported in [3].…”

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confidence: 99%

Quantitative Analysis Carbon-Carbon Bonds in a Multiwall Carbon Nanotube using Electron Diffraction

Zhang

Zuo

2009

Microsc Microanal

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Carbon is an important material that has attracted considerable attentions in the past and present. Carbon is also interesting because it can form several types of bonds from single to triple bonds. The Carbon-Carbon (C-C) bond distance changes from the pure single bond of 1.504 Ǻ to pure double bond of 1.334 Ǻ [1]. In carbon nanotubes, C-C bonds are subjected to a large deformation. Study of C bonds in nanotubes or other nanostructures is in general very difficult. Electron diffraction has been used for structure determination of single and double wall CNTs. However, accurate measurement of C-C bond distances in these cases is difficult from the lack of calibration of camera length and the inclination of nanotubes against the electron beam [2]. Here we report a general electron diffraction procedure for study of C-C bonds in MWCNTs. The analysis method is based on the layer line fitting method reported in [3].The MWCNTs studied here were synthesized by chemical vapor deposition (CVD) obtained from NANOCYL Company (France). Electron diffraction patterns were recorded from individual MWCNTs in the NED mode using the JEOL 2010F transmission electron microscope (TEM) with a field emission gun at 200 kV installed at University of Illinois. We used a nearly parallel electron nanobeam of about 50 nm in diameter in NED, and the pattern was recorded on imaging plates (IP) as shown in Figure 1. The diffraction pattern was analyzed first to assign chiral angles and diffraction layer lines to each wall. The layer lines were then fitted to measure the tube diameters, and this fitting takes account of the tube inclination, and the accuracy to determine the diameter has been largely enhanced by this fitting. The deviation could be further reduced by averaging the value from different layer lines of both the first and second order graphene reflections, and from different diffraction patterns taken from the same tube. The layer line positions together with the tube inclination angle were used to determine the helical repeat along the tube direction.Using the above method, we studied a small diameter MWCNTs of five walls with diameter ranging from ~16 to ~46 Å. The results revealed significant difference between the measured diameter and calculated diameter using the idea graphene C-C bond length of 1.421 Å. The smallest innermost wall of ~16 Å in diameter indicates a 3.8±0.4% of bond stretching around the tube. This radial stretching was also observed for larger diameter walls, but the amount of stretching reduces as the tube diameter increases. For the outmost wall with ~ 46 Å diameter, there is still 0.6±0.2% stretching as shown in Fig.2. It's obvious this radial stretching has strong diameter dependence, which shows larger stretching with smaller diameter and higher curvature. However, the axial periodicity along the tube direction is the same as the idea CNT value, and no diameter dependence was observed.

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Thermal and Structural Characterizations of Individual Single‐, Double‐, and Multi‐Walled Carbon Nanotubes

Pettes

Shi

2009

Adv Funct Materials

173

132

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Thermal conductance measurements of individual single‐ (S), double‐ (D), and multi‐ (M) walled (W) carbon nanotubes (CNTs) grown using thermal chemical vapor deposition between two suspended microthermometers are reported. The crystal structure of the measured CNT samples is characterized in detail using transmission electron microscopy (TEM). The thermal conductance, diameter, and chirality are all determined on the same individual SWCNT. The thermal contact resistance per unit length is obtained as 78–585 m K W−1 for three as‐grown 10–14 nm diameter MWCNTs on rough Pt electrodes, and decreases by more than 2 times after the deposition of amorphous platinum–carbon composites at the contacts. The obtained intrinsic thermal conductivity of approximately 42–48, 178–336, and 269–343 W m−1 K−1 at room‐temperature for the three MWCNT samples correlates well with TEM‐observed defects spaced approximately 13, 20, and 29 nm apart, respectively; whereas the effective thermal conductivity is found to be limited by the thermal contact resistance to be about 600 W m−1 K−1 at room temperature for the as‐grown DWCNT and SWCNT samples without the contact deposition.

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Quantitative structural analysis of individual nanotubes by electron diffraction

Cited by 18 publications

References 25 publications

Measurement of radial deformation of single-wall carbon nanotubes induced by intertube van der Waals forces

Measurement of radial deformation of single-wall carbon nanotubes induced by intertube van der Waals forces

Quantitative Analysis Carbon-Carbon Bonds in a Multiwall Carbon Nanotube using Electron Diffraction

Thermal and Structural Characterizations of Individual Single‐, Double‐, and Multi‐Walled Carbon Nanotubes

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