2002
DOI: 10.1109/lpt.2002.1003085
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Quantitative prediction of semiconductor laser characteristics based on low intensity photoluminescence measurements

Abstract: A general scheme for the determination of vital operating characteristics of semiconductor lasers from low intensity photoluminescence spectra is outlined and demonstrated. We describe a comprehensive model that allows us to determine properties of the running device like gain spectra, peak gain wavelengths, bandwidths or differential gains, as well as inhomogeneous broadening and actual carrier densities of PL-signals. This information can then be used to compute characteristics like the temperature dependenc… Show more

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Cited by 20 publications
(9 citation statements)
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“…The first validation of the connection between low carrier density PL and high density inverted semiconductor gain was made possible via a collaboration between a semiconductor growth team at AFRL, the University of Arizona ACMS research group and an experimental group at the University of Bochum in Germany in 2002 [14]. The sequence of steps involved in this validation procedure provide the first demonstration of a closed-loop wafer level diagnostic coupled to gain measurement on the processed sample.…”
Section: Wafer-level Diagnostics: From Photoluminescence To Gainmentioning
confidence: 99%
“…The first validation of the connection between low carrier density PL and high density inverted semiconductor gain was made possible via a collaboration between a semiconductor growth team at AFRL, the University of Arizona ACMS research group and an experimental group at the University of Bochum in Germany in 2002 [14]. The sequence of steps involved in this validation procedure provide the first demonstration of a closed-loop wafer level diagnostic coupled to gain measurement on the processed sample.…”
Section: Wafer-level Diagnostics: From Photoluminescence To Gainmentioning
confidence: 99%
“…The predictive capabilities of this method in determining the material gain spectra for a variety of materials has been proven in several publications. 6,8,10 The microscopic calculation of gain / absorption, refractive index and photo-luminescence spectra is described in detail in Refs. 6,12 and Refs.…”
Section: Theorymentioning
confidence: 99%
“…In contrast, the many-body theory microscopically accounts for the effects of carrier-carrier interaction, including excitonic correlations as well as carrier-phonon scattering. The predictive capabilities of this method in determining the material gain spectra for a variety of materials has been proven in several publications [25,27,29].…”
Section: Gainmentioning
confidence: 98%
“…A methodology has been described that makes it possible to use this procedure for on-wafer testing [28,29]. Static disorder in the quantum wells leads to an inhomogeneous broadening of optical resonances due to local fluctuations of the confinement potential.…”
Section: Sample Characterizationmentioning
confidence: 99%
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