Quantitative in-situ TEM study of stress-assisted grain growth

Kumar, Sandeep; Alam, Tarek; Haque, Aman

doi:10.1557/mrc.2013.15

Cited by 12 publications

(6 citation statements)

References 25 publications

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“…Some of the crystallites/grains also indicated preferential elongation demarcated by arrows and twin like deformation features presented in Fig. 4.24 b-c suggesting a favorable orientation of such grains with respect to the loading [161,162]. Similar to the observations of the present work, stress induced lowering of the activation energy of crystallite/grain growth/coarsening was also observed before in the case of Fe-Si-B system [27,94].…”

Section: Thermomechanical Effects Induced During Tensile Loadingsupporting

confidence: 89%

“…This observation clearly points toward the fact that localized stress and temperature developed in the fracture region reached the magnitudes which support further growth/coarsening of the crystallites/grains in that region. It has been reported in the case of nanocrystalline alloys that the applied stress can cause a stress assisted grain growth [159][160][161][162]. Such observations have been made in the case of tensile loading [162,163], compressive loading [164,165], and indentation experiments [159,166].…”

Section: Thermomechanical Effects Induced During Tensile Loadingmentioning

confidence: 87%

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Dynamic crystallization during non-isothermal laser treatment of Fe–Si–B metallic glass

Joshi

Gkriniari

Katakam

et al. 2015

J. Phys. D: Appl. Phys.

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Section: Thermomechanical Effects Induced During Tensile Loadingsupporting

confidence: 89%

Section: Thermomechanical Effects Induced During Tensile Loadingmentioning

confidence: 87%

Dynamic crystallization during non-isothermal laser treatment of Fe–Si–B metallic glass

Joshi

Gkriniari

Katakam

et al. 2015

J. Phys. D: Appl. Phys.

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“…Recently, MEMS-based devices, integrating actuators, sensors, and signal processing circuits, on a millimeter and even micrometer scales, have been developed at the head of the TEM holder for studying the structure–property relationships at the atomic scale [ 42 , 43 , 44 ]. Thus, the evolution of mechanical parameters and microstructure of materials have been simultaneously obtained.…”

Section: Introductionmentioning

confidence: 99%

MEMS Device for Quantitative In Situ Mechanical Testing in Electron Microscope

et al. 2017

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In this work, we designed a micro-electromechanical systems (MEMS) device that allows simultaneous direct measurement of mechanical properties during deformation under external stress and characterization of the evolution of nanomaterial microstructure within a transmission electron microscope. This MEMS device makes it easy to establish the correlation between microstructure and mechanical properties of nanomaterials. The device uses piezoresistive sensors to measure the force and displacement of nanomaterials qualitatively, e.g., in wire and thin plate forms. The device has a theoretical displacement resolution of 0.19 nm and a force resolution of 2.1 μN. The device has a theoretical displacement range limit of 5.47 μm and a load range limit of 55.0 mN.

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“…Mechanical stress has been shown to influence grain growth, primarily secondary type. 24,25 Electrical current can also anneal metallic films due to thermo-mechanical effects. For nanoscale thin films, the coupling among thermal, mechanical and electrical fields can produce synergistic effects, 26 allowing pronounced microstructural control at low temperature and stress.…”

Section: Introductionmentioning

confidence: 99%

In Situ Microstructural Control and Mechanical Testing Inside the Transmission Electron Microscope at Elevated Temperatures

Wang

Haque

2015

JOM

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With atomic-scale imaging and analytical capabilities such as electron diffraction and energy-loss spectroscopy, the transmission electron microscope has allowed access to the internal microstructure of materials like no other microscopy. It has been mostly a passive or post-mortem analysis tool, but that trend is changing with in situ straining, heating and electrical biasing. In this study, we design and demonstrate a multi-functional microchip that integrates actuators, sensors, heaters and electrodes with freestanding electron transparent specimens. In addition to mechanical testing at elevated temperatures, the chip can actively control microstructures (grain growth and phase change) of the specimen material. Using nano-crystalline aluminum, nickel and zirconium as specimen materials, we demonstrate these novel capabilities inside the microscope. Our approach of active microstructural control and quantitative testing with real-time visualization can influence mechanistic modeling by providing direct and accurate evidence of the fundamental mechanisms behind materials behavior.

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Quantitative in-situ TEM study of stress-assisted grain growth

Abstract: Abstract

Cited by 12 publications

References 25 publications

Dynamic crystallization during non-isothermal laser treatment of Fe–Si–B metallic glass

Dynamic crystallization during non-isothermal laser treatment of Fe–Si–B metallic glass

MEMS Device for Quantitative In Situ Mechanical Testing in Electron Microscope

In Situ Microstructural Control and Mechanical Testing Inside the Transmission Electron Microscope at Elevated Temperatures

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