Four-terminal measurements of impedance spectra have long been troubled by the presence of high frequency artifacts that typically indicate unphysically large inductive behavior. We follow up on the observation of Fleig et al., that voltage and current are necessarily measured in different locations of the potentiostat circuit, and that, typically, the electrometer input is a virtual ground. In this case, the capacitance of coaxial cables that connect sample electrodes to the potentiostat provides a high frequency conduction path to ground, so that some of the current that passes through the sample bypasses the electrometer. In four-electrode measurements, this mechanism produces the observed inductive artifacts. We examine a variety of simulated samples, with calculations compared to measurements of relevant circuits, to quantitatively investigate the nature of the artifacts. Model results agree with measurements when the leakage capacitances are properly included in the circuit analyses. With understanding of the origin of the inductive artifacts, the four-electrode method can be effectively utilized, enabling a combination of two-, three-and four-electrode measurements to be used to best advantage. Using this combination of electrode configurations, temperature dependent measurements of Impedance spectroscopy (IS) is used extensively for investigating ionic conducting solids, electrolytic solutions and interfaces, and for a large variety of specialized applications, including corrosion, biomedical fouling, and electrochemical kinetics, reactions, and processes.
1-3The technique is extensively used for investigating materials with electronic, ionic or mixed charges.The pioneering work of Bauerle 4 on yttria-stabilized zirconia (YSZ) demonstrated the utility of the technique for studying conducting solids. Intrinsic, grain boundary and contact resistances and capacitances were separately observed and quantified. The spectra were analyzed by viewing the sample as a material that could be represented, or simulated, with some combination of resistors and capacitors.In spite of the broad range of applications, the technique has been plagued by the presence of artifacts that limit its potential usefulness. The artifacts have been attributed to a variety of sources and procedures have been developed to identify those sources and to minimize their impact [5][6][7][8][9][10][11][12]