IEEE 1987 Ultrasonics Symposium 1987
DOI: 10.1109/ultsym.1987.198987
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Quantitative Effects of Substrate Tilt, Curvature and Deposition Position on Orientation in ZnO Films

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“…18 If the distance required for the c-axis to change orientation is on the order of an acoustic wavelength, the theoretical approach used in Eq. (2.12) may not accurately model the physical situation.…”
Section: Piezoelectric Modulationmentioning
confidence: 99%
“…18 If the distance required for the c-axis to change orientation is on the order of an acoustic wavelength, the theoretical approach used in Eq. (2.12) may not accurately model the physical situation.…”
Section: Piezoelectric Modulationmentioning
confidence: 99%