Quantitative depth distribution analysis of elements in high alloy steel using MCs+-SIMS approach

Karki, V.; Singh, Manjeet

doi:10.1016/j.ijms.2018.04.001

Cited by 12 publications

(6 citation statements)

References 28 publications

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“…A field aperture of 400 µm diameter was selected at the centre of the raster area in order to remove crater edge effects, which provided an analysis region of diameter ~33 µm. The analyses were carried out using MCs + secondary ion detection mode (M being the element of interest), in order to effectively reduce the matrix effects especially in the mixed layers [34]. Pressure in the analysis chamber was maintained at ~9 × 10 − 9 mbar and mass resolution (m/dm) of ~400 was used to reduce isobaric mass interferences, arising from the sample or from background gases present in the analysis chamber.…”

Section: Methodsmentioning

confidence: 99%

Thermal stability of interfacial mixed layers in c-Ni/a-Zr multilayer during annealing: Structural and magnetic properties

Bhattacharya

Karki

Singh

et al. 2022

Applied Surface Science

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Annealing of crystalline multilayers composed of two miscible elements usually causes interfacial mixing of the constituent atoms, possibly leading to the formation of binary alloys at the interfaces. Magnetron sputtered c-Ni/ a-Zr multilayers deposited at room temperature were vacuum annealed isochronally at 200 • C and 400 • C to observe thermal stability of the interfaces constituting the crystalline/amorphous multilayers. Control over the interfacial behaviour can aid the formation of materials with novel properties. The resultant changes in structural and magnetic properties of the multilayers were investigated in detail through X-ray Reflectivity, Polarized Neutron Reflectivity, SIMS and SQUID-based magnetization measurement techniques. The compositional variations in the amorphous mixed layers formed at the Ni-on-Zr and Zr-on-Ni interfaces due to atomic transport, were carefully observed as a function of annealing. Interface widths proceeded to increase with annealing at the expense of the Ni and Zr layers. The Ni-on-Zr interface was seen to be unstable at both temperatures; but the overall response of the interfaces to atomic diffusion was more pronounced when the multilayers were annealed at 400 • C. Under conditions of supersaturation of atoms within restricted spaces of the interfacial layers and the limited availability of components within the multilayer, unexpected demixing effects were observed at both the interfaces. A large increase in magnetic moment obtained after annealing at 400 • C, was attributed to the high densification of the Ni layers as well as to the incorporation of Ni crystallites into the Zr-on-Ni interface layers.

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Section: Methodsmentioning

confidence: 99%

Thermal stability of interfacial mixed layers in c-Ni/a-Zr multilayer during annealing: Structural and magnetic properties

Bhattacharya

Karki

Singh

et al. 2022

Applied Surface Science

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“…30,31 The SIMS analysis was performed for elemental chemical determination at the surface and, as the primary objective of this research, with the objective of developing a quantitative method for this technique through the depth profiles of ion-implanted samples. For all the samples studied, 16 O and 52 Cr were the ions selected for monitoring F I G U R E 1 Image of the sample holder with the ion beam impinging the selected irradiation area. It shows the arrangement of the target substrates during both implantations.…”

Section: Characterization and Analytical Techniquesmentioning

confidence: 99%

“…In nuclear fusion, the quantitative analysis, that is, the determination of impurities and composition of alloys in structural steels and first wall tungsten-based materials, [14][15][16][17] has also been investigated by SIMS, although the literature is scarce. In this sense, chromium is a fascinating element to quantify in these types of matrices since its presence plays a fundamental role for their mechanical, structural, and functional properties.…”

Section: Introductionmentioning

confidence: 99%

Quantification of secondary ion mass spectrometry measurements by using ion‐implanted metallic standards

Soria,

González,

Crespillo

et al. 2024

Surface & Interface Analysis

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This research addresses an analytical methodology to quantify elements of interest in fusion‐relevant materials using secondary ion mass spectrometry (SIMS). For this purpose, internal standards have been fabricated by ion implantation to avoid the well‐known matrix effect of this technique. In particular, chromium has been implanted at an energy of 12 MeV using two fluences in high‐purity iron and tungsten matrices together with Si control substrates. The latter were applied to determine the Cr concentration implanted through experimental and semiempirical methods. Specifically, the IBA technique Rutherford backscattering spectrometry (RBS) provided the quantitative results being 3.1 × 1019 at/cm3 and 1.6 × 1019 at/cm3 for the high and low dose, respectively. The SIMS depth profiles of Cr for the Fe and W matrices established an ion implantation depth close to 2 μm on both substrates in agreement with the calculations previously performed by Stopping and Range of Ions in Matter (SRIM) simulations. Correlation between the integration of SIMS profiles and known concentrations of the implanted ion resulted in the calibration curve for each matrix, obtaining the SIMS quantification approach by means of this relative sensitivity factor (RSF). Additionally, a cross‐check of the method by comparing commercial Fe‐Cr alloys with the Cr‐implanted Fe matrices of the present study pointed out the need to produce standards with higher chromium concentrations.

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“…In addition, RSF values are also utilized to determine the mean concentration of elements present in a particular matrix. 17 The RSF value of an element is always specific for a particular matrix under identical experimental conditions. Hence, to calculate the RSF value of an element in a particular matrix, a reference sample with a known concentration of the element and a similar matrix is required.…”

Section: Rsfmentioning

confidence: 99%

“…RSF of an element is used to convert the secondary ion intensity to concentration of the element in a SIMS depth profile analysis. In addition, RSF values are also utilized to determine the mean concentration of elements present in a particular matrix 17 . The RSF value of an element is always specific for a particular matrix under identical experimental conditions.…”

Section: Introductionmentioning

confidence: 99%

Determination of relative sensitivity factor, sputtering rate, and detection limits of deuterium in deuterium ion‐implanted Zircaloy‐4 using secondary ion mass spectrometer

Singh

Karki

Jaison

2022

Surface & Interface Analysis

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Zirconium‐based alloys are extensively used in the nuclear industry as materials for reactor core components. These alloys are used in fuel cladding and pressure tubes with 1H2O or 2H2O as the primary heat exchange fluid. Continuous usage of pressure tubes and fuel cladding inside the reactor results in heavy ingress of hydrogen (1H) or deuterium (2H), which gives rise to the formation of hydrogen (or deuterium) precipitates in the host of zirconium matrix. This is called hydrogen (or deuterium) embrittlement phenomenon. Therefore, determination of hydrogen or deuterium concentration periodically in zirconium alloy pressure tubes and cladding are crucial for safe operation of nuclear reactors. Hence, in this work, secondary ion mass spectrometry (SIMS) has been utilized to determine the relative sensitive factor (RSF), sputtering rate, and detection limits of 2H in 2H+ ion‐implanted Zircaloy‐4 sample. SIMS analysis has been carried out using O2+ and Cs+ primary ion beams. Depth profiles of various elemental and molecular secondary ions have been monitored to determine the RSF values and detection limits of 2H in the sample under different primary ion beam analysis conditions. Sputtering rate under different analysis conditions has also been determined from the correlation between the projected range of 2H+ ions in Zircaloy‐4 sample determined from Stopping and Range of Ions in Matter (SRIM) software and the depth of the crater formed by primary ion beam bombardment process. The projected range of 2H+ ions in Zircaloy‐4 was estimated to be ~524.2 nm using the simulation carried out by SRIM software. The projected range, evaluated by SRIM software, was utilized for depth scale calibration of SIMS sputtered time profiles. The SIMS depth profiles were also calibrated by determining the depth of the SIMS crater by using optical depth profilometer. The values of range estimated by SRIM as well as optical profilometer were found to be in good agreement, within instrument uncertainty.

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Quantitative depth distribution analysis of elements in high alloy steel using MCs+-SIMS approach

Cited by 12 publications

References 28 publications

Thermal stability of interfacial mixed layers in c-Ni/a-Zr multilayer during annealing: Structural and magnetic properties

Thermal stability of interfacial mixed layers in c-Ni/a-Zr multilayer during annealing: Structural and magnetic properties

Quantification of secondary ion mass spectrometry measurements by using ion‐implanted metallic standards

Determination of relative sensitivity factor, sputtering rate, and detection limits of deuterium in deuterium ion‐implanted Zircaloy‐4 using secondary ion mass spectrometer

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