2000
DOI: 10.1039/b001969k
|View full text |Cite
|
Sign up to set email alerts
|

Quantitative depth analysis using microsecond pulsed glow discharge atomic emission spectrometry

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1

Citation Types

0
24
0

Year Published

2001
2001
2017
2017

Publication Types

Select...
6
3

Relationship

1
8

Authors

Journals

citations
Cited by 35 publications
(24 citation statements)
references
References 7 publications
0
24
0
Order By: Relevance
“…3,4 In addition, the sputtering rate is reduced which renders PGD preferable for the analysis of thin films. [5][6][7][8] The pulsing process initiates different excitation and ionization mechanisms at the beginning, during and after the pulse with strong, medium and soft plasma conditions. [9][10][11] Using this feature and time-of-flight mass spectrometry one can extract elemental and molecular information from gaseous samples.…”
Section: Introductionmentioning
confidence: 99%
“…3,4 In addition, the sputtering rate is reduced which renders PGD preferable for the analysis of thin films. [5][6][7][8] The pulsing process initiates different excitation and ionization mechanisms at the beginning, during and after the pulse with strong, medium and soft plasma conditions. [9][10][11] Using this feature and time-of-flight mass spectrometry one can extract elemental and molecular information from gaseous samples.…”
Section: Introductionmentioning
confidence: 99%
“…At the layer interface, signals arise from both elements due to atomic mixing and GD nonuniformity on the sample surface. By converting sputter time to a corresponding erosion depth, the crossover point in Figure 4 can be used to calculate the thickness of the initial layer (14).…”
Section: P Pu Ul Ls Se Ed D G Gd D P Pr Ro Op Pe Er Rt Ti Ie Es Smentioning
confidence: 99%
“…Depending on the application, different techniques such as Auger electron spectroscopy (AES) [1,2], X-ray photoelectron spectroscopy (XPS) [3,4], secondary ion mass spectrometry (SIMS) [5,6] and glow discharge optical emission spectrometry (GD-OES) and mass spectrometry (GD-MS) [7][8][9][10] are used. Different limitations, such as restriction of sample shape or nature, long time required for analysis, poor lateral resolution and etc.…”
Section: Introductionmentioning
confidence: 99%
“…Influence of copper foil thickness(10,20,30, and 50 μm) on (a) P 0.5 , (b) AAR and (c) Δz for two cases of I N (open symbols) and C N (filled symbols) depth profiles shown inFig. 1.…”
mentioning
confidence: 99%