Quantitative Characterization by Transmission Electron Microscopy and Its Application to Interfacial Phenomena in Crystalline Materials
Seiichiro Ii
Abstract:This paper reviews quantitative characterization via transmission electron microscopy (TEM) and its application to interfacial phenomena based on the results obtained through the studies. Several signals generated by the interaction between the specimen and the electron beam with a probe size of less than 1 nm are utilized for a quantitative analysis, which yields considerable chemical and physical information. This review describes several phenomena near the interfaces, e.g., clear solid–vapor interface (surf… Show more
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