2009
DOI: 10.1016/j.ultramic.2009.05.010
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Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy

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Cited by 205 publications
(165 citation statements)
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“…Several schemes for quantitative analysis of annular dark field (ADF) images have been proposed. LeBeau et al [44] have used the maximum pixel intensity in the vicinity of the centroid of each atom image, while Van Aert et al [45] assume the intensity of each atom column is a cylindrically symmetric two-dimensional (2D) Gaussian and perform a least-squares fit. Neither of these is appropriate for the current case, where unresolved oxygen atoms lie close to the metal atoms; rather, we use intensities integrated over a Voronoi cell surrounding the atom column of interest.…”
Section: Introductionmentioning
confidence: 99%
“…Several schemes for quantitative analysis of annular dark field (ADF) images have been proposed. LeBeau et al [44] have used the maximum pixel intensity in the vicinity of the centroid of each atom image, while Van Aert et al [45] assume the intensity of each atom column is a cylindrically symmetric two-dimensional (2D) Gaussian and perform a least-squares fit. Neither of these is appropriate for the current case, where unresolved oxygen atoms lie close to the metal atoms; rather, we use intensities integrated over a Voronoi cell surrounding the atom column of interest.…”
Section: Introductionmentioning
confidence: 99%
“…using the standard Levenberg-Marquart L 2 -norm minimization method, similar to the methods of Van Aert et al [12]. x and y are the positions for the intensity I, and the fitted parameters are I 0 , A, x w , y w , x 0 , y 0 , and c. A Gaussian function was chosen for the fitting because the shape of the atomic column images is dominated by the incoherent source broadening, which is well approximated by a Gaussian function [13,14].…”
Section: Methodsmentioning
confidence: 99%
“…Here we report the 3D reconstruction of a complex crystalline nanoparticle at atomic resolution. To achieve this, we combined aberration-corrected scanning transmission electron microscopy [5][6][7] , statistical parameter estimation theory 8,9 and discrete tomography 10,11 . Unlike conventional electron tomography, only two images of the target-a silver nanoparticle embedded in an aluminium matrix-are sufficient for the reconstruction when combined with available knowledge about the particle's crystallographic structure.…”
mentioning
confidence: 99%
“…Previous attempts have mostly focused on the technique and image acquisition, whereas the interpretation of the images was oversimplified, not taking into account the detailed probe characteristics [20][21][22] and the statistical nature of the experimental data. Here, we combine aberration-corrected HAADF STEM carried out under low voltage conditions with modelbased statistical parameter estimation 8,9 and discrete tomography 10,11 to obtain a full atomic-scale 3D reconstruction of an embedded nanoparticle.…”
mentioning
confidence: 99%