2015
DOI: 10.1016/j.ress.2015.06.001
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Quantitative analysis of dynamic fault trees using improved Sequential Binary Decision Diagrams

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Cited by 56 publications
(45 citation statements)
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References 32 publications
(47 reference statements)
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“…As to how to judge whether or not a cut sequence is inclusive in another one, interested readers are encouraged to refer to Ge et al for more details.…”
Section: A Case Studymentioning
confidence: 99%
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“…As to how to judge whether or not a cut sequence is inclusive in another one, interested readers are encouraged to refer to Ge et al for more details.…”
Section: A Case Studymentioning
confidence: 99%
“…But it is worth noting that IEP methods are easily trapped in combinatorial explosion problem when the sizes of DFTs are very large. Comparatively, SDP methods can avoid state space explosion and combinatorial explosion problems by converting DFTs into sum of disjoint products forms and have shown notable advantages on computing efficiency …”
Section: Introductionmentioning
confidence: 99%
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“…DFT is widely used to model the dynamic systems as the extensions of the traditional static fault trees with sequence-and function-dependent failure behaviors. Ge et al present an improved sequential binary decision diagrams (SBDD) method for highly coupled DFT where different dynamic gates often coexist and interact sciENcE aNd tEchNology by repeated events [7]. A new approach was proposed by Merle et al to solve DFT with priority dynamic gate and repeated events [17].…”
Section: Introductionmentioning
confidence: 99%
“…Mo developed a multi‐value, decision‐diagram‐based DFT analysis method to analyze the reliability of large dynamic systems based on the state explosion and computational efficiency problems in DFT model. Moreover, Ge et al presented an improved sequential binary decision diagram method for quantitative analysis of DFT with interactive repeated events. It should be noted that in view of the dynamic characteristic in modern complex systems and taking advantage of the dynamic modeling ability of DFT, a DFT model should be built on the basis of system structure and failure behaviors …”
Section: Introduction and Literature Reviewmentioning
confidence: 99%