2004
DOI: 10.1154/1.1649329
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Quantitative analysis by X-ray induced total electron yield (TEY) compared to XRFA

Abstract: The theoretical concepts of the two methods are similar. Consequently, comparable fundamental parameter algorithms can be developed and applied to a quantitative analysis of bulk specimens and to an investigation of thin layers by TEY and by XRFA. Whereas the sampling depth of XRFA is determined by photoelectric absorption, for TEY the escape probability of electrons reduces this quantity to values of less than 100 nm. Thus, TEY is practically a surface analytical method with sampling depths between X-ray phot… Show more

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Cited by 4 publications
(2 citation statements)
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“…The overall angular dependence of the TEY signal is sufficiently involved to merit a separate consideration. [88][89][90] To circumvent these difficulties in the next section we use instead x-ray reflectometry, which in addition to chemical and valence profiles allows for extraction of atomic scattering factors in absolute units.…”
Section: š‘€45-edge Fit To Crystal Field Calculationsmentioning
confidence: 99%
“…The overall angular dependence of the TEY signal is sufficiently involved to merit a separate consideration. [88][89][90] To circumvent these difficulties in the next section we use instead x-ray reflectometry, which in addition to chemical and valence profiles allows for extraction of atomic scattering factors in absolute units.…”
Section: š‘€45-edge Fit To Crystal Field Calculationsmentioning
confidence: 99%
“…The magnitude of this current can serve as a measure of the incident or absorbed photon flux. This measurement mode is often referred to as total electron yield since all electrons that emerge from the surface as a result of photoemission are detected, independent of their energy (e.g., [8][9][10]).…”
Section: Introductionmentioning
confidence: 99%