“…Although many techniques are used to characterize the properties of half-metallic materials such as Andreev reflection (27,28), spin-polarized tunneling, spin-polarized photoemission (29), and visible MOKE (3), these all rely on surface measurements. However, device applications require coherence and functionality through a finite nanoscale depth, and bulk and surface properties can be significantly different (30)(31)(32)(33)(34). A strong advantage of using EUV MOKE as a probe of these materials is the larger penetration depth of EUV light, more than twice that of visible light, which can, in addition to providing elemental specificity, probe the magnetization state of the material more deeply inside of a device.…”