2023
DOI: 10.1016/j.sesci.2022.12.002
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Quantifying common major and minor elements in minerals/rocks by economical desktop scanning electron microscopy/silicon drift detector energy-dispersive spectrometer (SEM/SDD-EDS)

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Cited by 5 publications
(1 citation statement)
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“…Image-J software evaluated the secondary dendrite arm spacing (SDAS) and volume fraction of the phases in the as-cast samples using backscattered electrons images (BEI). Chen et al 21 investigated the EDX detection limits for quantifying common major and minor elements in minerals/rocks using economical desktop scanning electron microscopy/silicon drift detector energydispersive spectrometer. For instance, they found that the EDX microanalysis can show a detection limit close to 0.1 wt% for Al, Si and Ti.…”
Section: Microstructural Characterisationmentioning
confidence: 99%
“…Image-J software evaluated the secondary dendrite arm spacing (SDAS) and volume fraction of the phases in the as-cast samples using backscattered electrons images (BEI). Chen et al 21 investigated the EDX detection limits for quantifying common major and minor elements in minerals/rocks using economical desktop scanning electron microscopy/silicon drift detector energydispersive spectrometer. For instance, they found that the EDX microanalysis can show a detection limit close to 0.1 wt% for Al, Si and Ti.…”
Section: Microstructural Characterisationmentioning
confidence: 99%