Quality assurance in automotive electronics

Abstract

The qualification of semiconductor devices for automotive applications is based on a qualification procedure described in the AEC-Q100 and Q101 which are internationally accepted standards. As the requirements regarding reliability, lifetime and application conditions for automotive electronics are increasing dramatically this qualification method is not sufficient anymore to release the devices for the application in the car. In the following article new concepts for qualification and safe launch measures will be described. With the data resulting from a feasibility study for a new semiconductor package at Infineon Technologies the importance of extended stress tests beyond the AEC-Q100 will be shown.