2019
DOI: 10.1016/j.str.2019.07.004
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Qualitative Analyses of Polishing and Precoating FIB Milled Crystals for MicroED

Abstract: Microcrystal electron diffraction (MicroED) leverages the strong interaction between matter and electrons to determine protein structures from vanishingly small crystals. This strong interaction limits the thickness of crystals that can be investigated by MicroED, mainly due to absorption. Recent studies have demonstrated that focused ion beam (FIB) can thin even very large crystals into ideal sized lamellae however it is not clear how to best apply FIB-milling for MicroED. Here, The effects of polishing the l… Show more

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Cited by 37 publications
(69 citation statements)
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References 32 publications
(42 reference statements)
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“…Although the milling time decreased from ~60 min to ~20 min, the use of the higher current led to lower quality lamellae, diffracting to 7 -4 Å only. Of course, this could have been caused by other factors such as crystals grown to lower quality or damaged during transfer from crystallization probe to a TEM grid, nevertheless, it is worth mentioning that similar observations were reported by (Martynowycz et al, 2019b) in experiments on FIB-milled lamellae of proteinase K crystals. The authors utilized a cryo-FIB instrument similar to the one used in our present study and showed that focused Ga + beams with 10-pA and 30-pA current produced lamellae of different qualities, diffracting to 1.8 Å and 2.1 Å, respectively.…”
Section: Practical Aspects Of Lamella Preparationsupporting
confidence: 60%
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“…Although the milling time decreased from ~60 min to ~20 min, the use of the higher current led to lower quality lamellae, diffracting to 7 -4 Å only. Of course, this could have been caused by other factors such as crystals grown to lower quality or damaged during transfer from crystallization probe to a TEM grid, nevertheless, it is worth mentioning that similar observations were reported by (Martynowycz et al, 2019b) in experiments on FIB-milled lamellae of proteinase K crystals. The authors utilized a cryo-FIB instrument similar to the one used in our present study and showed that focused Ga + beams with 10-pA and 30-pA current produced lamellae of different qualities, diffracting to 1.8 Å and 2.1 Å, respectively.…”
Section: Practical Aspects Of Lamella Preparationsupporting
confidence: 60%
“…The specimen was kept at −192°C on the cryo-stage during the whole procedure. The lamella preparation protocol followed the approach published earlier (see (Schaffer et al, 2017;Martynowycz et al, 2019b;Zhou et al, 2019)). The crystal was coated with a conductive Pt-sputter (10 mA, 60 s) layer and a protective organometallic Pt-GIS (30°C, 80 s) layer.…”
Section: Sample Preparation For Ed Experiments By Cryo-fib Millingmentioning
confidence: 99%
“…Grid clips were marked with a dot on the top with a sharpie to indicate the milling direction. A thin layer of platinum (~10nm) was deposited on the grids by sputter coating prior to inspecting the grids using the SEM (Michael W Martynowycz et al, 2019). An additional layer (~300nm) of carbon-rich platinum was added on top of this using the gas injection system.…”
Section: Methodsmentioning
confidence: 99%
“…Crystals were identified in the SEM and FIB, brought to eucentric height, and milled using cleaning cross sections in steps into lamellae until a thickness of ~200nm as described (Duyvesteyn et al, 2018; Michael W. Martynowycz et al, 2019). The final polishing step used a gallium beam current of 10pA to remove the last few nm of crystal from the lamellae (Michael W Martynowycz et al, 2019).…”
Section: Methodsmentioning
confidence: 99%
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