2024
DOI: 10.33317/ssurj.589
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PVT Analysis and Behavioral Modeling of Doherty and Envelope Tracking RF ULP Power Amplifiers using 65 nm CMOS Technology

Muhammad Ovais Akhter,
Najam M. Amin,
Aurangzeb Rashid Masud

Abstract: This research encompasses both Process-Voltage-Temperature (PVT) considerations and behavioral modeling of two proposed Power Amplifier (PA) designs for wireless communication systems. Process variations, supply voltage changes, and temperature changes provide difficulties for the design and optimization of power amplifiers for wireless communication systems and may have a substantial influence on their effectiveness. PVT analysis and behavioral modeling have been conducted to address the aforementioned challe… Show more

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