“…Figure 5 a,b shows the XRD patterns and X-ray rocking curves of the Case I and Case II 4H-SiC single crystals in the (0004) direction, wherein it can be seen in Figure 4 a that all samples prepared by PVD were preferentially grown along strong (004) planes. In this figure, the XRD peaks observed at 35.6°, 38.1°, 43.2°, 49.7°, 57.2°, 65.7°, and 74.9° were attributed to the (004), (012), (013), (014), (015), (016), and (017) planes of the 4H-SiC phase, respectively [ 15 , 16 , 19 ]. All peaks were in good agreement with ICSD card 98-016-4971.…”