A recently proposed magnetooptical method of determination of interface mixing was applied to CdTe/CdMnTe superstructures grown by pulsed laser evaporation and epitaxy. Diffusion length were found ≈ 5 Ǻ for a multiple quantum well and > 15 Α for a superlattice. Ranges of Mn mole fractions and well width values enabling efficient application of the method were determined. PACS numbers: 73.20.Dx, 78.20.Ls, 75.50.Ppa It has been reported [1] that magnetoreflectivity can provide valuable information on interface quality in the CdTe/CdMnTe system. The Zeeman splitting of ground states of quantum wells with Cd 0 .7Mn0 . 3 Te barriers has been shown to be extremely sensitive to interface mixing between the nonmagnetic well and the barrier containing Mn++ ions, allowing to estimate the interface mixing range.In this work we test for the first time a superstucture grown using pulsed laser evaporation and epitaxy (PLEE) technique [2]. Besides testing the quality of the interface in the PLEE method, we shall try to estimate the useful range of the superstucture parameters, allowing efficient application of the magnetooptical method of interface characterization.In our experiment we analyzed two samples: a multiple quantum well (CCM108) with relatively large well thickness and a superlattice (CCM206). Samples were grown by PLEE method on (001) Cd0.95Zn0.05Te substrates. The multiple quantum well (MQW) contained 30 pairs of CdTe wells of nominal thickness 120 Α with 170 Α thick CdMnTe barriers. The superlattice (SL) contained 40 pairs of wells and barriers with thickness 20 Α and 95 Å , respectively. Both samples were grown on a CdMnTe buffer and covered by a CdTe capping layer.(571)