Pulsed laser deposition of Sr₂FeMoO₆thin films grown on spark plasma sintered Sr₂MgWO₆substrates

Combinatorial substrate epitaxy investigation of polytypic growth of AEMnO3 (AE = Ca, Sr)

“…In homopolytypic growth, for example, 3C on 3C or 4H on 4H , the eutaxial arrangement is the unit‐cell over unit‐cell arrangement, which is well known in epitaxial growth of 3C perovskites on single crystals. In prior CSE work, it was shown that 3C BiFeO 3 grew in this fashion on 3C La 0.7 Sr 0.3 MnO 3 ‐buffered 3C LaAlO 3 substrates, as did 3C Sr 2 FeMoO 6 on 3C Sr 2 MgWO 6 . For the metastable 3C SrMnO 3 investigated herein, this was also observed on (100) oriented SrTiO 3 single crystals, similar to earlier reports, and on (100) oriented grains in SrTiO 3 polycrystals.…”

“…Using CSE, we have analyzed the polytypic epitaxial growth of 3C and 4H perovskites on 3C and 4H substrates. As observed for other CSE experiments, [8][9][10][11][12][13][14][15] our films exhibited grain-over-grain epitaxy, allowing each individual grain to be treated as a single crystal, even for orientations with high Miller indices. All of the data shown above supports the hypothesis that the eutactic OR is the PEO for AEMnO 3 films on 4H SrMnO 3 and 3C SrTiO 3 polycrystalline substrates, over all of orientation space (ignoring the few outliers).…”

“…In CSE, polished polycrystalline substrates are used, which can be prepared in‐house for a wide range of structural families, and each grain of the substrate can be viewed as a single crystal with a unique orientation. Electron backscatter diffraction (EBSD) is used in CSE as a high‐throughput local structural probe to create phase and orientation maps across large areas of the substrate surface, as well as the deposited film . A single deposition of a film onto a polycrystalline substrate yields thousands of observations from which a broad understanding of phase stability and film‐substrate orientation relationships (ORs) can be developed.…”

“…Electron backscatter diffraction (EBSD) is used in CSE as a high-throughput local structural probe to create phase and orientation maps across large areas of the substrate surface, as well as the deposited film. [8][9][10][11][12][13][14][15] A single deposition of a film onto a polycrystalline substrate yields thousands of observations from which a broad understanding of phase stability and film-substrate orientation relationships (ORs) can be developed. For example, only a few ORs were found for epitaxial films on polycrystalline substrates across all of orientation space of the substrate.…”

Challenges in Sr2FeMoO6−δ Thin Film Deposition

“…Only one report used pure Si(100) as substrate . To reduce lattice mismatch, SrTiO 3 (001) substrates were covered with PLD Ba 0.4 Sr 0.6 TiO 3 (001) or with spark plasma‐sintered polycrystalline Sr 2 MgWO 6 . The study in ref.…”