2022
DOI: 10.1364/ol.462693
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Pulse-width-dependent critical power for self-focusing of ultrashort laser pulses in bulk dielectrics

Abstract: Microscale filamentation of 0.25 NA-focused, linearly and circularly polarized 1030 nm and 515 nm ultrashort laser pulses of variable pulse widths in fused silica, fluorite, and natural and synthetic diamonds demonstrates the Raman–Kerr effect in the form of critical pulse power magnitudes, proportional to squared wavelength and inversely proportional to laser pulse width of 0.3–10 ps. The first trend represents the common spectral relationship between the quantities, while the second indicates its time-integr… Show more

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Cited by 20 publications
(38 citation statements)
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“…Our side-view optical microscopy studies of blue recombination plasma emission form the filamentary tracks [ 21 ] in the np-FS ( Figure 1 c, inset) enabled us to identify the critical powers P cr for self-focusing and filamentation in this material, corresponding to the bottom limit pulse energy (P cr τ) for the laser filamentation onset of the 1030-nm and 515-nm pulses at different pulsewidths. The entire pulse energy ranges (0.018–0.045 μJ (1030 nm) and 0.05–0.11 μJ (515 nm)) were below the corresponding critical energy P cr τ for the utilized pulsewidths of 0.3–3.8 ps ( Figure 1 c), thus representing the linear (geometrical) focusing regime with the proposed interferential mechanism of nanograting inscription [ 19 , 22 ].…”
Section: Methodsmentioning
confidence: 99%
“…Our side-view optical microscopy studies of blue recombination plasma emission form the filamentary tracks [ 21 ] in the np-FS ( Figure 1 c, inset) enabled us to identify the critical powers P cr for self-focusing and filamentation in this material, corresponding to the bottom limit pulse energy (P cr τ) for the laser filamentation onset of the 1030-nm and 515-nm pulses at different pulsewidths. The entire pulse energy ranges (0.018–0.045 μJ (1030 nm) and 0.05–0.11 μJ (515 nm)) were below the corresponding critical energy P cr τ for the utilized pulsewidths of 0.3–3.8 ps ( Figure 1 c), thus representing the linear (geometrical) focusing regime with the proposed interferential mechanism of nanograting inscription [ 19 , 22 ].…”
Section: Methodsmentioning
confidence: 99%
“…High-order non-linearities are known to be related to multi-photon absorption (imaginary parts) and the generation of higher harmonics or wave-mixing (real parts), while low-order non-linearities emerge as laser beam Kerr self-focusing and filamentation (upstream non-linear focus), once the peak pulse power exceeds the critical one [ 36 ]. Critical powers for self-focusing on non-linear media are known to be wavelength-, polarization-, and even beam shape-dependent [ 36 , 37 , 38 ], while in diamonds the intra-gap OCs could function as intermediate resonances, enhancing such optical non-linearities [ 72 ].…”
Section: Basic Physical Processes Of Ultrashort Pulse Laser-diamond I...mentioning
confidence: 99%
“…Meanwhile, at higher peak laser powers >0.4 MW in the natural diamond and >3 MW in the HPHT diamond the longitudinal extension symmetry breaks, indicating the predominating extension of the PL tracks upstream (toward the pump fs-laser). Usually, if screening plasma shadow does not appear within the focal region in a bulk dielectric, such asymmetry could be considered as a solid indication of self-focusing and formation of non-linear focus prior to the geometrical (linear) one [ 36 , 38 , 74 ]. As a result, the critical power values P cr ≈ 0.4–0.5 MW for the natural diamond and ≈3 MW for the HPHT diamond can be derived at the 1030 nm wavelength [ 38 , 74 ] ( Figure 3 b) and compared to the previous measurements at the same and other vis-NIR wavelengths ( Figure 3 d).…”
Section: Basic Physical Processes Of Ultrashort Pulse Laser-diamond I...mentioning
confidence: 99%
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“…Comparing to the Raman (428 nm) and N3 ZPL (415 nm) PL signals (Figure 3d-i), respectively, the acquired 3D image and the depth profiles of the much more intense, normalized green-red PL intensity variation (Figure 3a-c) allow measurement of the micromark length, diameter and PL contrast (normalized intensity) as a function of peak laser power and exposure (Figure 4a-c). Specifically, once the peak pulse laser power P exceeds the critical power for self-focusing, P cr , in the natural diamond at the 515 nm laser wavelength (P cr ≈ 0.5 MW [15,16]), the extended photoluminescent micromarks could be observed in the diamond bulk in front of the geometrical focal region (Figure 4a). This filamentary inscription regime (P ≥ P cr ) enables up-and down-scaling of the micromark lengths according to the square root dependence [17], as well as of micromark diameter and PL contrast (Figure 4a-c).…”
Section: Power-and Exposure-dependent Characteristics Of Micromarks V...mentioning
confidence: 99%