Pulse Plated Cadmium Telluride Films and Their Characteristics

Abstract

Cadmium Telluride thin films were deposited on conducting glass and titanium substrates by the pulse plating technique at different duty cycles in the range 10 - 50 %. The films were characterized by x-ray diffraction and they were found to possess single phase cubic structure. Optical studies indicated a direct band gap of 1.45 eV. Surface morphology of the films indicated that the crystallite size increases with increase of duty cycle. XPS studies confirmed the formation of CdTe. EDAX studies were made to estimate the composition. Cross plane resistivity measurements indicated that the resistivity decreases with increase of duty cycle.