2001
DOI: 10.1103/physrevb.65.020405
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Pt magnetization profile in a Pt/Co bilayer studied by resonant magnetic x-ray reflectometry

Abstract: The Pt magnetization depth profile at a single buried Pt/Co interface was investigated by x-ray resonant magnetic reflectivity measurements. The asymmetry as function of angle of incidence has been measured in the Pt L 3 -near-edge absorption region at two energies. Observed asymmetry ratios in the order of 0.5% are described on the basis of a magnetically modified Parratt algorithm. Excellent agreement between simulations and experiment was achieved for a Pt magnetic moment of 0.21 B at the rough interface fo… Show more

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Cited by 127 publications
(92 citation statements)
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References 24 publications
(19 reference statements)
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“…By observing the difference in the specular reflectivity for the two magnetization directions parallel and antiparallel to the photon helicity of circularly polarized x-rays in an energy scan across the L 2,3 edge of a magnetic element, one can derive the magnetization profile of a ferromagnetic thin film. This has been demonstrated convincingly for [Co 2 MnGe/Au] 50 multilayers [182] and other systems [174,198,173]. Since in the [Co 2 MnGe/V] 20 multilayers under study here, we have two magnetic elements, the analysis for Mn and Co can be carried out separately.…”
Section: Soft X-ray Scatteringmentioning
confidence: 94%
See 1 more Smart Citation
“…By observing the difference in the specular reflectivity for the two magnetization directions parallel and antiparallel to the photon helicity of circularly polarized x-rays in an energy scan across the L 2,3 edge of a magnetic element, one can derive the magnetization profile of a ferromagnetic thin film. This has been demonstrated convincingly for [Co 2 MnGe/Au] 50 multilayers [182] and other systems [174,198,173]. Since in the [Co 2 MnGe/V] 20 multilayers under study here, we have two magnetic elements, the analysis for Mn and Co can be carried out separately.…”
Section: Soft X-ray Scatteringmentioning
confidence: 94%
“…X-ray resonant magnetic scattering (XRMS) allows for the determination of elementspecific chemical and magnetic depth profiles of layered structures [172,173,174]. These profiles can be obtained by a quantitative analysis of specular reflectivity measurements, usually performed by numerical simulation.…”
Section: Specular Reflectivitymentioning
confidence: 99%
“…The experimental demonstration of large changes in the specularly reflected X-ray intensity at the Fe L 2,3 edge 5 upon magnetization reversal initiated the ongoing search for magneto-optical (MO) effects in the soft X-ray regime, 6,7,8,9,10,11,12 as well as their application to element-specific studies of heteromagnetic systems. 13,14,15,16,17,18 Yet, in analyzing soft X-ray MO signals from thin films and multilayer systems with thicknesses comparable to the X-ray wavelength, previous investigations have shown 5,13,18 that a comparison with model calculations …”
mentioning
confidence: 99%
“…The experimental demonstration of large changes in the specularly reflected X-ray intensity at the Fe L 2,3 edge 5 upon magnetization reversal initiated the ongoing search for magneto-optical (MO) effects in the soft X-ray regime, 6,7,8,9,10,11,12 as well as their application to element-specific studies of heteromagnetic systems. 13,14,15,16,17,18 Yet, in analyzing soft X-ray MO signals from thin films and multilayer systems with thicknesses comparable to the X-ray wavelength, previous investigations have shown 5,13,18 that a comparison with model calculations 19 of the reflected specular intensity (based on the Fresnel equations) is needed in order to extract a layerresolved sample magnetization profile. Several experimental determinations of soft X-ray MO constants have been reported 8,9,10 for ferromagnetic transition metals in the region of the L 2,3 thresholds, but none so far for the lanthanide elements, despite their wide recognition as, e.g., constituents of exchange-spring magnets 20 and magnetic recording media 21 .…”
mentioning
confidence: 99%
“…Alternatively, M S can be derived from the total magnetic moment of Co and Pd atoms from the XMCD data of the t Pd = 1.5 nm sample. For Co, m [84,85]. As an estimation, the polarization of 0.6 nm of Pd, corresponding to a sample for which it can be assumed that all Pd is alloyed within the Co NPs, will add ≈0.4 × 10 −3 emu/cm 2 .…”
Section: Magnetic Momentsmentioning
confidence: 99%