2006
DOI: 10.1063/1.2348781
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Pseudoheterodyne detection for background-free near-field spectroscopy

Abstract: The authors present a detection technique for scattering-type near-field optical microscopy capable of background interference elimination in the entire near-UV to far-IR spectral range. It simultaneously measures near-field optical signal amplitude and phase by interferometric detection of scattered light utilizing a phase-modulated reference wave. They compare its background suppression efficiency to other known methods and experimentally show that it provides a reliable near-field optical material contrast … Show more

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Cited by 480 publications
(519 citation statements)
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References 28 publications
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“…It is based on an atomic force microscope (AFM), where the tip is illuminated with monochromatic infrared radiation of frequency ω. Recording of the tipscattered infrared field with a pseutoheterodyne interferometer yields infrared amplitude and phase images simultaneously with topography [45]. Strong phase contrast reveals areas of strong molecular vibrational absorption [46,47].…”
Section: Membrane Characterizationmentioning
confidence: 99%
“…It is based on an atomic force microscope (AFM), where the tip is illuminated with monochromatic infrared radiation of frequency ω. Recording of the tipscattered infrared field with a pseutoheterodyne interferometer yields infrared amplitude and phase images simultaneously with topography [45]. Strong phase contrast reveals areas of strong molecular vibrational absorption [46,47].…”
Section: Membrane Characterizationmentioning
confidence: 99%
“…[20][21][22][23] However, the notorious interference and electromagnetic coupling of the probe tip especially to metallic samples continues to be a troublesome limiting factor. Often it prevents even qualitative interpretation of aSNOM images.…”
mentioning
confidence: 99%
“…The photoelectric signal is therefore not proportional to scattered intensity but the electric field itself. [20][21][22][23] Recording it twice with a relative phase shift of 90°in the reference yields optical amplitude and phase information. Figure 2 (and Figure 4) show representative measurement results for small and large nanodisks.…”
mentioning
confidence: 99%
“…1 Sketch of s-SNOM. The basic AFM is operated with its tip-sample separation z modulated at frequency Ω. Backscattering of an applied laser beam is detected interferometrically, in the sketched example using a Michelson configuration and a phase modulation at frequency M for electronic sideband filtering (pseudoheterodyne detection) [6].…”
Section: Experimental Techniquementioning
confidence: 99%
“…5 Mid-infrared near-field microscopy of highly-doped semiconductors Much of the advancement of s-SNOM has been attained using the CO 2 and CO lasers, in the 9-11µm and 5-6µm wavelength regions, respectively [5,6,8,10,11,20,21,24,[27][28][29][30][31][32][33][34][35][36][37]. This came first of all because mid-infrared can be used to exploit chemical fingerprints for recognizing chemical composition, now at nanometric resolution [8,31,33,37,38], but furthermore for technical reasons.…”
Section: Apertureless Near-field Microscopy Development From Microwavmentioning
confidence: 99%