Abstract:Particle‐induced X‐ray emission (PIXE) is an analytical method based upon X‐ray spectrometry. In the vast majority of applications, a proton beam is used to eject inner‐shell electrons from atoms in a solid specimen (target). When the resulting vacancies are filled by outer‐shell electrons, characteristic X‐rays whose energies identify the particular atom are emitted.
Proton PIXE is performed by a small particle accelerator (the most widely used is the Van de Graaff machine at a 2–3 MV voltage, more … Show more
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