Proton-Induced Output Clock SEU and SEFI Characterization of the ADC12D1620 12-Bit Analog-to-Digital Converter

Dungan, R.; Nakamura, Eric; Tran, Thien; Myers, J. A.; Parker, John J.; Suela, Fernan

doi:10.1109/redw51883.2020.9325829

2020 IEEE Radiation Effects Data Workshop (In Conjunction With 2020 NSREC) 2020

DOI: 10.1109/redw51883.2020.9325829

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Proton-Induced Output Clock SEU and SEFI Characterization of the ADC12D1620 12-Bit Analog-to-Digital Converter

R. Dungan

Eric Nakamura

Thien Tran

et al.

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Proton-Induced Output Clock SEU and SEFI Characterization of the ADC12D1620 12-Bit Analog-to-Digital Converter

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