2011
DOI: 10.1016/j.ultramic.2011.03.005
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Prospects for lithium imaging using annular bright field scanning transmission electron microscopy: A theoretical study

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Cited by 37 publications
(26 citation statements)
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“…It is interesting to note that based on simulation studies, the ABF STEM detector setting comes out as the optimal annular detector setting to detect light atoms in the proximity of heavier scatterers, as suggested elsewhere. 2,[6][7][8]11,13 We also noticed local optima for the conventional ADF setting when using an accelerating voltage of 300 kV, which are not expected based on contrast comparisons. Also for a lower accelerating voltage of 80 kV, the ABF STEM setting was found to be optimal in order to detect lithium in the LiV 2 O 4 crystal.…”
Section: Fig 2 Pmentioning
confidence: 61%
See 1 more Smart Citation
“…It is interesting to note that based on simulation studies, the ABF STEM detector setting comes out as the optimal annular detector setting to detect light atoms in the proximity of heavier scatterers, as suggested elsewhere. 2,[6][7][8]11,13 We also noticed local optima for the conventional ADF setting when using an accelerating voltage of 300 kV, which are not expected based on contrast comparisons. Also for a lower accelerating voltage of 80 kV, the ABF STEM setting was found to be optimal in order to detect lithium in the LiV 2 O 4 crystal.…”
Section: Fig 2 Pmentioning
confidence: 61%
“…5 As direct imaging of light elements is necessary for the full determination of crystal structures, such as cathode materials for lithium-ion batteries, this topic has recently become very important and a lot of research has been done in this field in the past few years. Not only the identification of individual lithium atoms [6][7][8][9] but also the direct imaging of other light elements, such as carbon, oxygen or nitrogen, 2,10-12 and even hydrogen 13 has been investigated. In these studies, the experimental settings are often determined in terms of direct visual interpretability using classical performance measures, such as contrast or signal-to-noise ratio (SNR).…”
mentioning
confidence: 99%
“…A high-angle annular dark-field (HAADF) detector provides an image exhibiting a contrast that is proportional to the atomic number (~Z 1.7 ) of the atoms, whereas an annular brightfield (ABF) detector provides an image contrast proportional tĂ” Z −1/3 , which is ideal for imaging light elements such as lithium. 5,6 A STEM BF detector, which collects elastically scattered electrons, provides phase contrast images that are equivalent to standard BF transmission electron microscopy (TEM) images. 7 By contrast, low-angle annular dark-field imaging forms images by collecting both elastically and inelastically scattered electrons that contribute to the detected signal, and it allows the mapping of strain fields in materials at an atomic resolution.…”
Section: Recent Advancements In Aem Capabilitiesmentioning
confidence: 99%
“…New or little-used imaging modes are being explored, such as annular bright-field imaging in the STEM, about which Rose had speculated many years earlier [148], see for example [111,137,[32][33][34]77,78]. The merits of over-correction are considered in [195].…”
Section: Falloutmentioning
confidence: 99%
“…New development in correction of spherical aberration of electromagnetic round lens. In International Symposium on Electron Microscopy (K. Kuo and J. Yao, Eds), [28][29][30][31][32][33][34][35]Singapore A.V. .…”
Section: Note On Appendices a And Bmentioning
confidence: 99%